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High-sensitivity imaging with lateral resonance mode atomic force microscopy
Nanoscale
◽
10.1039/c6nr04151e
◽
2016
◽
Vol 8
(43)
◽
pp. 18421-18427
◽
Cited By ~ 2
Author(s):
Ren-Feng Ding
◽
Chih-Wen Yang
◽
Kuang-Yuh Huang
◽
Ing-Shouh Hwang
Keyword(s):
Atomic Force Microscopy
◽
High Sensitivity
◽
Resonance Mode
◽
Force Microscopy
◽
Atomic Force
◽
Lateral Resonance
◽
Mode Atomic Force Microscopy
Download Full-text
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References
Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation
Nanotechnology
◽
10.1088/0957-4484/24/30/305702
◽
2013
◽
Vol 24
(30)
◽
pp. 305702
◽
Cited By ~ 3
Author(s):
Chih-Wen Yang
◽
Ren-Feng Ding
◽
Shih-Hsiu Lai
◽
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◽
Wei-Chiao Lai
◽
...
Keyword(s):
Atomic Force Microscopy
◽
Lorentz Force
◽
Resonance Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
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Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface
Ultramicroscopy
◽
10.1016/j.ultramic.2008.11.016
◽
2009
◽
Vol 109
(3)
◽
pp. 275-279
◽
Cited By ~ 7
Author(s):
Ayhan Yurtsever
◽
Alexander M. Gigler
◽
Robert W. Stark
Keyword(s):
Atomic Force Microscopy
◽
Frequency Modulation
◽
Resonance Mode
◽
Mineral Surface
◽
Force Microscopy
◽
Atomic Force
◽
Amplitude And Frequency Modulation
◽
Mode Atomic Force Microscopy
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Dynamic nano-triboelectrification using torsional resonance mode atomic force microscopy
Scientific Reports
◽
10.1038/srep27874
◽
2016
◽
Vol 6
(1)
◽
Cited By ~ 6
Author(s):
Wei Cai
◽
Nan Yao
Keyword(s):
Atomic Force Microscopy
◽
Resonance Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
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Soft-contact imaging in liquid with frequency-modulation torsion resonance mode atomic force microscopy
Nanotechnology
◽
10.1088/0957-4484/21/6/065710
◽
2010
◽
Vol 21
(6)
◽
pp. 065710
◽
Cited By ~ 14
Author(s):
Chih-Wen Yang
◽
Ing-Shouh Hwang
Keyword(s):
Atomic Force Microscopy
◽
Frequency Modulation
◽
Resonance Mode
◽
Soft Contact
◽
Force Microscopy
◽
Atomic Force
◽
Contact Imaging
◽
Mode Atomic Force Microscopy
Download Full-text
Frequency modulated torsional resonance mode atomic force microscopy on polymers
Applied Physics Letters
◽
10.1063/1.2907498
◽
2008
◽
Vol 92
(14)
◽
pp. 143103
◽
Cited By ~ 11
Author(s):
Ayhan Yurtsever
◽
Alexander M. Gigler
◽
Christian Dietz
◽
Robert W. Stark
Keyword(s):
Atomic Force Microscopy
◽
Resonance Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
Download Full-text
Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials
Applied Physics Letters
◽
10.1063/1.125581
◽
1999
◽
Vol 75
(26)
◽
pp. 4198-4200
◽
Cited By ~ 39
Author(s):
G. Bar
◽
L. Delineau
◽
R. Brandsch
◽
M. Bruch
◽
M.-H. Whangbo
Keyword(s):
Atomic Force Microscopy
◽
Indentation Depth
◽
Microscopy Study
◽
Atomic Force Microscopy Study
◽
Tapping Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
Download Full-text
Contact force identification using the subharmonic resonance of a contact-mode atomic force microscopy
Nanotechnology
◽
10.1088/0957-4484/16/2/004
◽
2005
◽
Vol 16
(2)
◽
pp. 199-207
◽
Cited By ~ 32
Author(s):
Eihab M Abdel-Rahman
◽
Ali H Nayfeh
Keyword(s):
Atomic Force Microscopy
◽
Contact Force
◽
Subharmonic Resonance
◽
Contact Mode
◽
Force Identification
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
Download Full-text
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements
Review of Scientific Instruments
◽
10.1063/1.2801009
◽
2007
◽
Vol 78
(10)
◽
pp. 103707
◽
Cited By ~ 48
Author(s):
Ozgur Sahin
Keyword(s):
Atomic Force Microscopy
◽
Time Varying
◽
Force Measurements
◽
Tapping Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
Download Full-text
Effect of Viscoelastic Properties of Polymers on the Phase Shift in Tapping Mode Atomic Force Microscopy
Langmuir
◽
10.1021/la980969p
◽
1998
◽
Vol 14
(26)
◽
pp. 7343-7347
◽
Cited By ~ 36
Author(s):
Georg Bar
◽
Rainer Brandsch
◽
Myung-Hwan Whangbo
Keyword(s):
Atomic Force Microscopy
◽
Phase Shift
◽
Viscoelastic Properties
◽
Tapping Mode
◽
Force Microscopy
◽
Atomic Force
◽
Mode Atomic Force Microscopy
Download Full-text
Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles
Langmuir
◽
10.1021/la9908844
◽
1999
◽
Vol 15
(25)
◽
pp. 8569-8573
◽
Cited By ~ 35
Author(s):
William E. Farneth
◽
R. Scott McLean
◽
John D. Bolt
◽
Eleni Dokou
◽
Mark A. Barteau
Keyword(s):
Atomic Force Microscopy
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Tapping Mode
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Force Microscopy
◽
Atomic Force
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Mode Atomic Force Microscopy
Download Full-text
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