Accumulation of counterions and coions evaluated by cryogenic XPS as a new tool for describing the structure of electric double layer at the silica/water interface

2017 ◽  
Vol 19 (43) ◽  
pp. 29047-29052 ◽  
Author(s):  
Jiří Škvarla ◽  
Mária Kaňuchová ◽  
Andrey Shchukarev ◽  
Ivan Brezáni ◽  
Juraj Škvarla
Keyword(s):  
Double Layer ◽  
Photoelectron Spectroscopy ◽  
Electric Double Layer ◽  
Liquid Interface ◽  
New Method ◽  
Water Interface ◽  
Spectroscopy Technique ◽  
X Ray ◽  
Solid Liquid Interface ◽  
Solid Liquid

We introduce a new method of evaluating the structure of electric double layer (EDL) at the native solid/liquid interface using cryogenic X-ray photoelectron spectroscopy technique.

scholarly journals How the hydroxylation state of the (110)-rutile TiO2 surface governs its electric double layer properties

2021 ◽  
Author(s):  
Sebastien Groh ◽  
Holger-dietrich Sassnick ◽  
Victor Ruiz ◽  
Joachim Dzubiella
Keyword(s):  
Force Field ◽  
Double Layer ◽  
Electrical Double Layer ◽  
Electric Double Layer ◽  
Liquid Interface ◽  
Oxide Surface ◽  
Tio2 Surface ◽  
Reactive Force ◽  
Solid Liquid Interface ◽  
Solid Liquid

The hydroxylation state of an oxide surface is a central property of its solid/liquid interface and its corresponding electrical double layer. This study integrated both a reactive force field (ReaxFF)...

scholarly journals Using “Tender” X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Stephanus Axnanda ◽  
Ethan J. Crumlin ◽  
Baohua Mao ◽  
Sana Rani ◽  
Rui Chang ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
Liquid Interface ◽  
X Ray ◽  
Solid Liquid Interface ◽  
Solid Liquid
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