scholarly journals Correction: High-temperature X-ray diffraction and thermal expansion of nanocrystalline and coarse-crystalline acanthite α-Ag2S and argentite β-Ag2S

2018 ◽  
Vol 20 (5) ◽  
pp. 3847-3850
Author(s):  
S. I. Sadovnikov ◽  
A. I. Gusev ◽  
A. V. Chukin ◽  
A. A. Rempel
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Chem Phys ◽  
X Ray Diffraction ◽  
X Ray ◽  
Phys Chem Chem Phys

Correction for ‘High-temperature X-ray diffraction and thermal expansion of nanocrystalline and coarse-crystalline acanthite α-Ag2S and argentite β-Ag2S’ by S. I. Sadovnikov et al., Phys. Chem. Chem. Phys., 2016, 18, 4617–4626.

Thermal analysis of rare earth gallates and aluminates

1990 ◽  
Vol 5 (1) ◽  
pp. 183-189 ◽  
Author(s):  
H. M. O'Bryan ◽  
P. K. Gallagher ◽  
G. W. Berkstresser ◽  
C. D. Brandle
Keyword(s):  
Thermal Analysis ◽  
Thermal Expansion ◽  
High Temperature ◽  
Superconducting Films ◽  
Czochralski Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
First Order ◽  
Expansion Matching ◽  
First Order Phase

Dilatometry, high-temperature x-ray diffraction, differential thermal analysis, and differential scanning calorirmetry have been performed on LaGaO3, NdGaO3, PrGaO3, SmAlO3, and LaAlO3 single crystals grown by the Czochralski technique. First order phase transitions have been located at 145°C for LaGaO3 and 785°C for SmAlO3, and ΔH has been measured for the LaGaO3 transition. Second order transitions have been identified for LaGaO3, PrGaO3, NdGaO3, and LaAlO3. The usefulness of these compounds as substrates for high temperature superconducting films is discussed in terms of thermal expansion matching.

Relationship Between Thermal Expansion and Crystal Chemical Parameters in Diborides

1986 ◽  
Vol 30 ◽  
pp. 503-510
Author(s):  
H.A. McKinstry ◽  
Lai Daik Chai ◽  
R.V. Sara ◽  
K.E. Spear
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Zirconium Phosphate ◽  
Hexagonal Structure ◽  
Crystal Chemical ◽  
X Ray Diffraction ◽  
Chemical Parameters ◽  
X Ray ◽  
Sodium Zirconium ◽  
Sodium Zirconium Phosphate

Thermal expansion is an interesting, ubiquitous and neglected property of materials. Recently, Lenain et al. (1985) and Limaye (1986) have been investigating anisotropy in the low-expansion structures of the sodium zirconium phosphate family. In the hexagonal structure one axis expands while another contracts. In going from the calcium to the strontium analog the anisotropy actually changes sign. A change in anisotropy between CrB2 and TiB2 had been observed by R.V. Sara (1960). The results in Fig. 1 obtained by high temperature x-ray diffraction measurements indicate that for TiB2 the thermal expansion of the c-axis is greater than the expansion of the a-axis, whereas for CrB2 the reverse is true.

Polymorphic transformations and thermal expansion of some modifications in Ag1.5Cu0.5Se and Ag0.4Cu1.6Se

2019 ◽  
Vol 33 (23) ◽  
pp. 1950271 ◽  
Author(s):  
Y. I. Aliyev ◽  
Y. G. Asadov ◽  
A. O. Dashdemirov ◽  
R. D. Aliyeva ◽  
T. G. Naghiyev ◽  
...  
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Temperature Dependence ◽  
Single Crystals ◽  
Diffraction Method ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
Polymorphic Transformations ◽  
X Ray

The Ag[Formula: see text]Cu[Formula: see text]Se and Ag[Formula: see text]Cu[Formula: see text]Se compounds have been synthesized and grown as single crystals. High-temperature X-ray diffraction method was used to study polymorphic transformations. It is shown that the Ag[Formula: see text]Cu[Formula: see text]Se crystals of high-temperature FCC modification are decomposed into Ag2Se and AgCuSe when the temperature decreases below T = 488 K and Ag[Formula: see text]Cu[Formula: see text]Se is decomposed into Cu2Se and AgCuSe when the temperature decreases below T = 540 K. Transformations in both compounds are reversible. Crystalline parameters are obtained and the temperature dependence of the lattice parameters for each phase is built.

High-temperature X-ray Diffraction Measurement of Sanidine Thermal Expansion

2000 ◽  
Vol 79 (8) ◽  
pp. 1590-1595 ◽  
Author(s):  
J.R. Mackert ◽  
S.W. Twiggs ◽  
A.L. Williams
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray

Lattice parameters and thermal expansion of the T2-phase of the Nb–Si–B system investigated by high-temperature X-ray diffraction

2004 ◽  
Vol 12 (2) ◽  
pp. 181-188 ◽  
Author(s):  
Geovani Rodrigues ◽  
Carlos Angelo Nunes ◽  
Paulo Atsushi Suzuki ◽  
Gilberto Carvalho Coelho
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray
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