Spectrally resolved cathodoluminescence analyses in the optical near-field

1999 ◽  
Vol 194 (2-3) ◽  
pp. 412-414 ◽  
Author(s):  
Cramer ◽  
Sergeev ◽  
Heiderhoff ◽  
Balk
2004 ◽  
Vol 831 ◽  
Author(s):  
A. Neogi ◽  
B. P. Gorman ◽  
H. Morkoç ◽  
T. Kawazoe ◽  
M. Ohtsu ◽  
...  

ABSTRACTWe investigate the spatial distribution and emission properties of self-assembled GaN/AlN quantum dots. High-resolution transmission electron microscopy reveals near vertical correlation among the GaN dots due to a sufficiently thin AlN spacer layer thickness, which allows strain induced stacking. Scanning electron and atomic force microscopy show lateral coupling due to a surface roughness of ∼ 50–60 nm. Near-field photoluminescence in the illumination mode (both spatially and spectrally resolved) at 10 K revealed emission from individual dots, which exhibits size distribution of GaN dots from localized sites in the stacked nanostructure. Strong spatial localization of the excitons is observed in GaN quantum dots formed at the tip of self-assembled hexagonal pyramid shapes with six [101 1] facets.


1996 ◽  
Vol 79 (8) ◽  
pp. 3831 ◽  
Author(s):  
I. Hörsch ◽  
R. Kusche ◽  
O. Marti ◽  
B. Weigl ◽  
K. J. Ebeling

1996 ◽  
Vol 69 (6) ◽  
pp. 827-829 ◽  
Author(s):  
Yasunori Toda ◽  
Motonobu Kourogi ◽  
Motoichi Ohtsu ◽  
Yasushi Nagamune ◽  
Yasuhiko Arakawa

Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.


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