Novel approaches to confidence bound generation for neural network representations

Author(s):  
R. Shao
Author(s):  
Luting Yang ◽  
Jianyi Yang ◽  
Shaolei Ren

Contextual bandit is a classic multi-armed bandit setting, where side information (i.e., context) is available before arm selection. A standard assumption is that exact contexts are perfectly known prior to arm selection and only single feedback is returned. In this work, we focus on multi-feedback bandit learning with probabilistic contexts, where a bundle of contexts are revealed to the agent along with their corresponding probabilities at the beginning of each round. This models such scenarios as where contexts are drawn from the probability output of a neural network and the reward function is jointly determined by multiple feedback signals. We propose a kernelized learning algorithm based on upper confidence bound to choose the optimal arm in reproducing kernel Hilbert space for each context bundle. Moreover, we theoretically establish an upper bound on the cumulative regret with respect to an oracle that knows the optimal arm given probabilistic contexts, and show that the bound grows sublinearly with time. Our simula- tion on machine learning model recommendation further validates the sub-linearity of our cumulative regret and demonstrates that our algorithm outper- forms the approach that selects arms based on the most probable context.


Algorithms ◽  
2019 ◽  
Vol 12 (11) ◽  
pp. 240 ◽  
Author(s):  
Stefan Klus ◽  
Patrick Gelß

Interest in machine learning with tensor networks has been growing rapidly in recent years. We show that tensor-based methods developed for learning the governing equations of dynamical systems from data can, in the same way, be used for supervised learning problems and propose two novel approaches for image classification. One is a kernel-based reformulation of the previously introduced multidimensional approximation of nonlinear dynamics (MANDy), the other an alternating ridge regression in the tensor train format. We apply both methods to the MNIST and fashion MNIST data set and show that the approaches are competitive with state-of-the-art neural network-based classifiers.


2004 ◽  
Vol 40 (6) ◽  
pp. 599-604
Author(s):  
Xiongfeng FENG ◽  
Masanori SUGISAKA ◽  
Xianhui YANG ◽  
Yongmao XU

Author(s):  
Donghyun Kim

In this paper, we propose 2 novel methods for brain tumor detection in MRI images. In the first proposed approach, we build upon prior research on ensemble methods by testing the concatenation of pre-trained models: features extracted via transfer learning are merged and segmented by classification algorithms or a stacked ensemble of those algorithms. In the second approach, we expand upon prior studies on convolutional neural networks: a convolutional neural network involving a specific module of layers is used for classification. The first approach achieved accuracy scores of 0.98 and the second approach achieved a score of 0.863, outperforming a benchmark VGG-16 model. Considerations to granular computing and circuit complexity theory are given in the paper as well.


Author(s):  
Arthur V. Jones

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.


2000 ◽  
Vol 25 (4) ◽  
pp. 325-325
Author(s):  
J.L.N. Roodenburg ◽  
H.J. Van Staveren ◽  
N.L.P. Van Veen ◽  
O.C. Speelman ◽  
J.M. Nauta ◽  
...  

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