Investigation of traps producing current collapse in AlGaN/GaN high electron mobility transistors
2011 ◽
Vol 50
(6)
◽
pp. 061001
◽
2010 ◽
Vol 54
(11)
◽
pp. 1430-1433
◽
2011 ◽
2012 ◽
Vol 28
(2)
◽
pp. 029501
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2013 ◽
Vol 52
(4S)
◽
pp. 04CF08
◽