scholarly journals Avoiding instabilities in power electronic systems: toward an on‐chip implementation

2017 ◽  
Vol 10 (13) ◽  
pp. 1778-1787 ◽  
Author(s):  
Abdullah Abusorrah ◽  
Kuntal Mandal ◽  
Damian Giaouris ◽  
Abdelali El Aroudi ◽  
Mohammed M. Al‐Hindawi ◽  
...  
2019 ◽  
Vol 158 ◽  
pp. 326-343 ◽  
Author(s):  
Daniel Tormo ◽  
Lahoucine Idkhajine ◽  
Eric Monmasson ◽  
Ricardo Vidal-Albalate ◽  
Ramon Blasco-Gimenez

2002 ◽  
Vol 122 (8) ◽  
pp. 775-780
Author(s):  
Yasuaki Kuroe ◽  
Mikihiko Matsui

2007 ◽  
Author(s):  
R. E. Crosbie ◽  
J. J. Zenor ◽  
R. Bednar ◽  
D. Word ◽  
N. G. Hingorani

2020 ◽  
Vol 9 (3) ◽  
pp. 63-72
Author(s):  
Andreas Bendicks ◽  
Tobias Dorlemann ◽  
Timo Osterburg ◽  
Stephan Frei

2015 ◽  
Vol 821-823 ◽  
pp. 810-813 ◽  
Author(s):  
Maxime Berthou ◽  
Dominique Planson ◽  
Dominique Tournier

With the commercial availability of SiC power transistors, this decade will mark an important breakthrough in power transistor technology. However, in power electronic systems, disturbances may place them in short-circuit condition and little knowledge exist about their SC capability. This paper presents our study of SiC MOSFETs, JFETs and BJT under capacitive load short-circuit up to 600V.


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