Nanostructured LaFeO3 /Si Thin Films Grown by Pulsed Laser Deposition
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The orthorhombic LaFeO3 thin films grown by pulsed laser deposition on silicon showed nano-structuration of their surface and preferential crystallographic exposed facets, depending on the deposition temperature. The LaFeO3 film deposited at 850°C has two types of grain termination, flat or tip-like, corresponding to two different growth directions, respectively [110] and [200]. Due to the shape of the termination, the same {110} facets are exposed. The LaFeO3 is iron deficient and consequently contains oxygen vacancies, the exact chemical formula being LaFe0.82O3-delta.
2012 ◽
Vol 258
(7)
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pp. 2674-2678
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2010 ◽
Vol 20
(3)
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pp. 1553-1556
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2002 ◽
Vol 3
(1)
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pp. 14-17
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2020 ◽
Vol 36
(6)
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pp. 537-551
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2016 ◽
Vol 28
(1)
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pp. 446-453
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