Nonlinear optical waveguide fabrication by direct electron-beam irradiation and thermal development using a high Tg polymer

1997 ◽  
Vol 71 (14) ◽  
pp. 1924-1926 ◽  
Author(s):  
Hideki Nakayama ◽  
Okihiro Sugihara ◽  
Naomichi Okamoto
Keyword(s):  
Electron Beam ◽  
Optical Waveguide ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Thermal Development ◽  
Waveguide Fabrication

Channel-optical-waveguide fabrication based on electron-beam irradiation of polyimides

1995 ◽  
Vol 34 (6) ◽  
pp. 1047 ◽  
Author(s):  
Yasuko Yamada Maruo ◽  
Sigekuni Sasaki ◽  
Toshiaki Tamamura
Keyword(s):  
Electron Beam ◽  
Optical Waveguide ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Waveguide Fabrication

Electron-beam irradiation-induced nonlinearity in silicate glass films and fabrication of nonlinear optical gratings

1999 ◽  
Vol 86 (5) ◽  
pp. 2393-2396 ◽  
Author(s):  
Makoto Nakanishi ◽  
Okihiro Sugihara ◽  
Naomichi Okamoto ◽  
Hisashi Fujimura ◽  
Chikara Egami
Keyword(s):  
Electron Beam ◽  
Silicate Glass ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Optical Gratings ◽  
Glass Films

Tuning the third-order nonlinear optical properties of In:ZnO thin films by 8 MeV electron beam irradiation

2017 ◽  
Vol 110 ◽  
pp. 260-265 ◽  
Author(s):  
Nayana Shettigar ◽  
S. Pramodini ◽  
I.V. Kityk ◽  
M. Abd-Lefdil ◽  
E.M. Eljald ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Electron Beam ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Nonlinear Optical Properties ◽  
Beam Irradiation ◽  
Third Order ◽  
The Third

Fabrication technique of a nonlinear optical structure using optical polymeric films by direct electron-beam irradiation

1998 ◽  
Vol 37 (7) ◽  
pp. 1213 ◽  
Author(s):  
Hideki Nakayama ◽  
Hisashi Fujimura ◽  
Chikara Egami ◽  
Okihiro Sugihara ◽  
Ryoka Matsushima ◽  
...  
Keyword(s):  
Electron Beam ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Polymeric Films ◽  
Fabrication Technique ◽  
Beam Irradiation ◽  
Optical Structure

Nonlinear-optical characterization of planar domain patterns written in LiNbO3 by electron-beam irradiation

2018 ◽  
Vol 75 ◽  
pp. 325-330 ◽  
Author(s):  
S.D. Lavrov ◽  
L.S. Kokhanchik ◽  
R.V. Gainutdinov ◽  
A.S. Elshin ◽  
Ya.V. Bodnarchuk ◽  
...  
Keyword(s):  
Electron Beam ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Optical Characterization ◽  
Planar Domain ◽  
Beam Irradiation

Optical channel waveguide fabrication based on electron beam irradiation of silica

1990 ◽  
Vol 57 (27) ◽  
pp. 2902-2903 ◽  
Author(s):  
S. J. Madden ◽  
Mino Green ◽  
D. Barbier
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Channel Waveguide ◽  
Optical Channel ◽  
Beam Irradiation ◽  
Waveguide Fabrication

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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