Emission spectrum of hard x-rays, generated from iron, copper, and molybdenum targets by subpicosecond KrF laser pulses

2001 ◽  
Vol 78 (9) ◽  
pp. 1195-1197 ◽  
Author(s):  
N. Takeyasu ◽  
Y. Hirakawa ◽  
T. Imasaka
2002 ◽  
Vol 56 (9) ◽  
pp. 1161-1164 ◽  
Author(s):  
N. Takeyasu ◽  
Y. Hirakawa ◽  
T. Imasaka

Characteristic hard X-rays emitted from a laser-produced plasma induced by focusing a femtosecond KrF laser pulse are employed for elemental analysis. The emission spectrum of the hard X-ray arising from a stainless steel sample is measured by means of a single-photon-counting X-ray detector equipped with a multichannel analyzer. The elemental analysis is carried out from the photon energy of the Kα line observed in the X-ray emission spectrum, and a calibration curve is constructed for Fe using stainless steel samples prepared at different concentrations (SUS-301, 310, and 316). A continuum band was overlapped on the sharp Kα lines in the X-ray spectrum, which made the assignment of the weak characteristic Kα lines arising from minor elements difficult. In order to suppress this undesirable emission, a prepulse technique was employed. The continuum emission was shifted toward lower energies, and, as a result, the characteristic Kα lines were more clearly observable. The potential advantages of the present approach are also discussed in this study.


2003 ◽  
Vol 18 (5) ◽  
pp. 1123-1130 ◽  
Author(s):  
V. Oliveira ◽  
R. Vilar

This paper aims to contribute to the understanding of column formation mechanisms in Al2O3–TiC ceramics micromachined using excimer lasers. Chemical and structural characterization of columns grown in Al2O3–TiC composite processed with 200 KrF laser pulses at 10 J/cm2 was carried out by scanning electron microscopy, transmission electron microscopy, x-ray photoelectron spectroscopy, and x-ray diffraction analysis. Fully developed columns consist of a core of unprocessed material surrounded by an outer layer of Al2TiO5, formed in oxidizing conditions, and an inner layer, formed in reducing conditions, composed of TiC and Al3Ti or an AlTi solid solution. Possible mechanisms of column formation are discussed.


1995 ◽  
Vol 10 (8) ◽  
pp. 1884-1888 ◽  
Author(s):  
S. Krishnan ◽  
M.I. Chaudhry ◽  
S.V. Babu

Amorphous silicon germanium (a-SiGe) films, deposited on silicon substrates at room temperature in a molecular beam epitaxy system, were transformed into a single-crystal film and doped with phosphorus by exposure to KrF laser pulses. Electron channeling patterns showed that laser exposure resulted in crystallization of the undoped a-SiGe films. The SiGe films were doped by laser irradiation, using a phosphorus spin-on-dopant. The sheet resistance of the doped films decreased with increasing numbers of pulses, reaching a value of about ∼ 5 × 104 ohms/□ after 15 pulses. I-V data from mesa-type n-SiGe/p-Si diode devices were used to determine the effect of laser processing on the quality of the SiGe films.


2020 ◽  
Vol 8 ◽  
Author(s):  
Zsolt Kovács ◽  
Barnabás Gilicze ◽  
Sándor Szatmári ◽  
István B. Földes

1996 ◽  
Vol 80 (1) ◽  
pp. 509-512 ◽  
Author(s):  
Y. Y. Tsui ◽  
R. Fedosejevs ◽  
C. E. Capjack
Keyword(s):  

1994 ◽  
Vol 76 (9) ◽  
pp. 5047-5053 ◽  
Author(s):  
R. Bobkowski ◽  
J. N. Broughton ◽  
R. Fedosejevs ◽  
R. J. Willis ◽  
M. R. Cervenan

1973 ◽  
Vol 17 ◽  
pp. 423-435
Author(s):  
C. M. Dozier ◽  
P. G. Burkhalter ◽  
B. M. Klein ◽  
D. J. Nagel ◽  
R. R. Whitlock

AbstractIntense x-rays are emitted by plasmas formed when sub-nanosecond laser pulses are focused onto materials, Plasmas produced by pulses containing up to 100 J can re-emit over ten percent of the energy as x-rays above about 1.0 keV. These plasmas may be useful flash x-ray sources.


1988 ◽  
Author(s):  
T D. Raymond ◽  
C Reiser ◽  
R G. Adams ◽  
R B. Michie ◽  
C Woods
Keyword(s):  

1979 ◽  
Vol 9 (10) ◽  
pp. 1322-1323 ◽  
Author(s):  
A N Kirkin ◽  
Aleksandr M Leontovich ◽  
A M Mozharovskiĭ ◽  
Evgenii N Ragozin

2014 ◽  
Vol 47 (1) ◽  
pp. 188-197 ◽  
Author(s):  
Changyong Song ◽  
Kensuke Tono ◽  
Jaehyun Park ◽  
Tomio Ebisu ◽  
Sunam Kim ◽  
...  

X-ray free-electron lasers (XFELs) provide intense (∼1012 photons per pulse) coherent X-rays with ultra-short (∼10−14 s) pulse lengths. X-rays of such an unprecedented nature have introduced new means of atomic scale structural investigations, and discoveries are still ongoing. Effective use of XFELs would be further accelerated on a highly adaptable platform where most of the new experiments can be realized. Introduced here is the multiple-application X-ray imaging chamber (MAXIC), which is able to carry out various single-pulse diffraction experiments including single-shot imaging, nanocrystallographic data acquisition and ultra-fast pump–probe scattering for specimens in solid, liquid and gas phases. The MAXIC established at the SPring-8 ångström compact free-electron laser (SACLA) has demonstrated successful applications in the aforementioned experiments, but is not limited to them. Also introduced are recent experiments on single-shot diffraction imaging of Au nanoparticles and serial crystallographic data collection of lysozyme crystals at SACLA.


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