Effect of charge exchange ions upon Langmuir probe current

2002 ◽  
Vol 81 (11) ◽  
pp. 1961-1963 ◽  
Author(s):  
Zoltan Sternovsky ◽  
Scott Robertson
Keyword(s):  
Charge Exchange ◽  
Langmuir Probe ◽  
Probe Current

The contribution of charge exchange ions to cylindrical Langmuir probe current

2003 ◽  
Vol 10 (1) ◽  
pp. 300-309 ◽  
Author(s):  
Z. Sternovsky ◽  
S. Robertson ◽  
M. Lampe
Keyword(s):  
Charge Exchange ◽  
Langmuir Probe ◽  
Probe Current ◽  
Cylindrical Langmuir Probe

scholarly journals Multineedle Langmuir Probe Operation and Acute Probe Current Susceptibility to Spacecraft Potential

2019 ◽  
Vol 47 (8) ◽  
pp. 3816-3823
Author(s):  
Magnus F. Ivarsen ◽  
Bjorn Lybekk ◽  
Huy Hoang ◽  
Lei Yang ◽  
Lasse B. N. Clausen ◽  
...  
Keyword(s):  
Langmuir Probe ◽  
Probe Current ◽  
Spacecraft Potential

Fast electron temperature diagnostic based on Langmuir probe current harmonic detection on DIII-D

2001 ◽  
Vol 72 (1) ◽  
pp. 453-456 ◽  
Author(s):  
D. L. Rudakov ◽  
J. A. Boedo ◽  
R. A. Moyer ◽  
R. D. Lehmer ◽  
G. Gunner ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Fast Electron ◽  
Langmuir Probe ◽  
Harmonic Detection ◽  
Current Harmonic ◽  
Probe Current ◽  
Temperature Diagnostic

Langmuir Probe Current in Turbulent Flow of Weakly Ionized Gas

1967 ◽  
Vol 22 (5) ◽  
pp. 1302-1302
Author(s):  
Koichi Takeda ◽  
Koichi Saito ◽  
Yoshisuke Hatta
Keyword(s):  
Turbulent Flow ◽  
Langmuir Probe ◽  
Ionized Gas ◽  
Probe Current ◽  
Weakly Ionized

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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