Point-contact current-imaging atomic force microscopy: Measurement of contact resistance between single-walled carbon nanotubes in a bundle

2003 ◽  
Vol 82 (12) ◽  
pp. 1944-1946 ◽  
Author(s):  
Yoichi Otsuka ◽  
Yasuhisa Naitoh ◽  
Takuya Matsumoto ◽  
Tomoji Kawai
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Contact Resistance ◽  
Point Contact ◽  
Single Walled Carbon Nanotubes ◽  
Atomic Force Microscopy Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Measurement ◽  
Walled Carbon Nanotubes

Efficient Charge-Transfer from Diketopyrrolopyrroles to Single-Walled Carbon Nanotubes

Nanoscale ◽  
2021 ◽  
Author(s):  
Ilias Papadopoulos ◽  
Arjun Puthiyedath ◽  
Fabian Plass ◽  
Desiré Molina ◽  
Christina Harreiss ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Charge Transfer ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Efficient Charge ◽  
Walled Carbon Nanotubes ◽  
State Charge

In this contribution, the excited state charge-transfer interactions between single walled carbon nanotubes (SWCNTs) and a variety of phenyl, 4-bromophenyl, and thiophene substituted diketopyrrolopyrroles (DPPs), is described. Atomic force microscopy...

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