Apertureless near-field scanning optical microscope based on a quartz tuning fork

2003 ◽  
Vol 74 (8) ◽  
pp. 3889-3891 ◽  
Author(s):  
Y. De Wilde ◽  
F. Formanek ◽  
L. Aigouy
2002 ◽  
Vol 19 (9) ◽  
pp. 1268-1270 ◽  
Author(s):  
Wang Pei ◽  
Lu Yong-Hua ◽  
Zhang Jiang-Ying ◽  
Ming Hai ◽  
Xie Jian-Ping ◽  
...  

2003 ◽  
Vol 02 (04n05) ◽  
pp. 225-230
Author(s):  
CHIEN-WEN HUANG ◽  
NIEN-HUA LU ◽  
CHIH-YEN CHEN ◽  
CHENG-FENG YU ◽  
TSUNG-SHENG KAO ◽  
...  

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.


2005 ◽  
Vol 86 (15) ◽  
pp. 153506 ◽  
Author(s):  
Songhui Kim ◽  
Hyunjun Yoo ◽  
Kiejin Lee ◽  
Barry Friedman ◽  
Mariafrancis A. Gaspar ◽  
...  

2003 ◽  
Vol 209 (3) ◽  
pp. 205-208 ◽  
Author(s):  
N. H. Lu ◽  
C. W. Huang ◽  
C. Y. Chen ◽  
C. F. Yu ◽  
T. S. Kao ◽  
...  

2000 ◽  
Vol 71 (2) ◽  
pp. 437-443 ◽  
Author(s):  
Konstantin B. Shelimov ◽  
Dmitri N. Davydov ◽  
Martin Moskovits

Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.


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