DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE

2003 ◽  
Vol 02 (04n05) ◽  
pp. 225-230
Author(s):  
CHIEN-WEN HUANG ◽  
NIEN-HUA LU ◽  
CHIH-YEN CHEN ◽  
CHENG-FENG YU ◽  
TSUNG-SHENG KAO ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Single Mode ◽  
Optical Microscope ◽  
Sensing Element ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Design And Construction

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

2002 ◽  
Author(s):  
Chien W. Huang ◽  
Nien H. Lu ◽  
Chih Y. Chen ◽  
Cheng Feng Yu ◽  
Tsung S. Kao ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Short Fiber ◽  
Fiber Probe ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

scholarly journals A Tapping-Mode Tuning Fork with a Short Fibre Probe Sensor for a Near-Field Scanning Optical Microscope

2002 ◽  
Vol 19 (9) ◽  
pp. 1268-1270 ◽  
Author(s):  
Wang Pei ◽  
Lu Yong-Hua ◽  
Zhang Jiang-Ying ◽  
Ming Hai ◽  
Xie Jian-Ping ◽  
...  
Keyword(s):  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Short Fibre ◽  
Tapping Mode ◽  
Fibre Probe ◽  
Near Field Scanning ◽  
Probe Sensor

Near-Field Scanning Optical Microscopy Studies of Materials and Devices

MRS Bulletin ◽  
1997 ◽  
Vol 22 (8) ◽  
pp. 27-30 ◽  
Author(s):  
J.W.P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Light Source ◽  
Optical Fibers ◽  
Force Feedback ◽  
Near Field ◽  
Single Mode ◽  
Field Zone ◽  
Research Activities ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) provides a means to study optical and optoelectronic properties of materials at the nanometer scale. The key to achieving resolution higher than the diffraction limit is to place a subwavelength-sized light source—e.g., an aperture—within the near-field zone of the sample. In this case, the area of the sample illuminated is determined by the aperture size and not by the wavelength (see Figure 1). An image can then be formed by moving the sample and light source with respect to each other. While the principle of near-field optics is straightforward, its realization at visible-light wavelengths was not achieved until the invention of scanning-probe techniques in the 1980s. Since Betzig et al. demonstrated in 1991 that bright subwavelength apertures can be made by tapering and metal-coating single-mode optical fibers, research activities involving NSOM have increased tremendously. The later incorporation of shear-force feedback to regulate tip-sample separation adds another strength to NSOM. Using this distance regulation, a topographic image similar to that obtained by a conventional scanning force microscope is acquired simultaneously with the optical image. This provides a way to correlate structural and physical properties at the same sample positions and greatly simplifies interpretation of the NSOM data.

Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

1997 ◽  
Vol 474 ◽  
Author(s):  
E. B. McDaniel ◽  
J. W. P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Microscope ◽  
Nanometer Scale ◽  
Polarization Modulation ◽  
Reflection Symmetry ◽  
Strain Fields ◽  
Modulation Technique ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

Progress in near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 46 ◽  
pp. 436-437
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Visible Region ◽  
Optical Microscope ◽  
Scanning Tunneling ◽  
Far Field ◽  
Tunneling Microscopy ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Scanning Electron

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

Towards High-Speed Near-Field Scanning Optical Microscope

2004 ◽  
Author(s):  
Yuan Wang ◽  
Cheng Sun ◽  
Nicholas Fang ◽  
Xiang Zhang
Keyword(s):  
Optical Microscopy ◽  
High Speed ◽  
Near Field ◽  
Optical Microscope ◽  
Systematic Investigation ◽  
Information Storage ◽  
Scanning Optical Microscopy ◽  
Serial Scanning ◽  
Optimized Conditions ◽  
Near Field Scanning

Recently, near-field scanning optical microscopy (NSOM) and its variations, which combine the scanning probe technology with optical microscopy, have been intensively applied in the study of biology, material science, surface chemistry, information storage, and nanofabrication. However, due to the serial scanning nature, the speed at which NSOM can successively records highly resolved images is rather limited. This hampers the applications of NSOM in characterizing dynamic response of particular samples. In this article, we perform systematic investigation of NSOM system parameters, which include scan rate, signal detector amplification, and illumination intensity. In this work, a model of signal flow for the NSOM system has been established to quantitatively investigate the interplay of the key process parameters and to further explore the technique solutions for high-speed NSOM imaging. The model is in good agreement with experimental results and the optimized conditions for high speed NSOM imaging are suggested.

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