scholarly journals Humidity effects on the determination of elastic properties by atomic force acoustic microscopy

2004 ◽  
Vol 95 (5) ◽  
pp. 2403-2407 ◽  
Author(s):  
D. C. Hurley ◽  
J. A. Turner
1998 ◽  
Author(s):  
A. Pageler ◽  
Klaus Kosbi ◽  
Ulf G. Brauneck ◽  
Hans Gerd G. Busmann ◽  
Siegfried Boseck

2003 ◽  
Vol 94 (4) ◽  
pp. 2347-2354 ◽  
Author(s):  
D. C. Hurley ◽  
K. Shen ◽  
N. M. Jennett ◽  
J. A. Turner

Ultrasonics ◽  
2000 ◽  
Vol 38 (1-8) ◽  
pp. 430-437 ◽  
Author(s):  
U. Rabe ◽  
S. Amelio ◽  
E. Kester ◽  
V. Scherer ◽  
S. Hirsekorn ◽  
...  

2004 ◽  
Vol 838 ◽  

ABSTRACTTip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the process of tip wear and its influence on AFAM measurements of material elastic properties, we have performed a series of experiments and compared tip geometries calculated from experimental data with direct tip visualization in the scanning electron microscope (SEM). Using a sample with known elastic properties, the tip-sample contact stiffnesses for several different cantilevers were determined. Hertz and Derjaguin-Müller-Toporov (DMT) contact-mechanics models were applied to calculate values of the tip radius R from the experimental data. At the same time, values for R before and after each sequence of AFAM measurements were obtained from SEM images. Both methods showed that the tip radius increased with use. However, values of R calculated with the theoretical models varied indeterminately from those obtained from the SEM images. In addition, in some cases analysis of the AFAM measurements suggested a hemispherical tip, while the corresponding SEM images showed that the end of the tip was flat. We also observed other changes in tip shape, such as an increase in the tip width. By combining theoretical models for contact mechanics with visual information on the tip geometry we hope to better understand contact characteristic in AFM-based systems.Contribution of NIST, an agency of the US government; not subject to copyright.


2001 ◽  
Vol 392 (1) ◽  
pp. 75-84 ◽  
Author(s):  
S. Amelio ◽  
A.V. Goldade ◽  
U. Rabe ◽  
V. Scherer ◽  
B. Bhushan ◽  
...  

2012 ◽  
Vol 420 (1-3) ◽  
pp. 94-100 ◽  
Author(s):  
D. Laux ◽  
D. Baron ◽  
G. Despaux ◽  
A.I. Kellerbauer ◽  
M. Kinoshita

2011 ◽  
Vol 115 (16) ◽  
pp. 4826-4833 ◽  
Author(s):  
Erasmo Ovalle-García ◽  
José J. Torres-Heredia ◽  
Armando Antillón ◽  
Iván Ortega-Blake

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