scholarly journals Topotaxial growth of Ti2AlN by solid state reaction in AlN∕Ti(0001) multilayer thin films

2007 ◽  
Vol 90 (17) ◽  
pp. 174106 ◽  
Author(s):  
C. Höglund ◽  
M. Beckers ◽  
N. Schell ◽  
J. v. Borany ◽  
J. Birch ◽  
...  
JOM ◽  
2021 ◽  
Author(s):  
Evgeny T. Moiseenko ◽  
Sergey M. Zharkov ◽  
Roman R. Altunin ◽  
Oleg V. Belousov ◽  
Leonid A. Solovyov ◽  
...  

JOM ◽  
2021 ◽  
Author(s):  
Evgeny T. Moiseenko ◽  
Sergey M. Zharkov ◽  
Roman R. Altunin ◽  
Oleg V. Belousov ◽  
Leonid A. Solovyov ◽  
...  

2021 ◽  
pp. 159474
Author(s):  
Sergey M. Zharkov ◽  
Roman R. Altunin ◽  
Vladimir V. Yumashev ◽  
Evgeny T. Moiseenko ◽  
Oleg V. Belousov ◽  
...  

1995 ◽  
Vol 269 (1-2) ◽  
pp. 102-107 ◽  
Author(s):  
Jae-Yeob Shim ◽  
Joon-Seop Kwak ◽  
Eung-Jun Chi ◽  
Hong-Koo Baik ◽  
Sung-Man Lee

Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.


2020 ◽  
Vol 2 (12) ◽  
pp. 3880-3888
Author(s):  
Jian Hui ◽  
Qingyun Hu ◽  
Yuxi Luo ◽  
Tianxing Lai ◽  
Zhan Zhang ◽  
...  

1993 ◽  
Vol 73 ◽  
pp. 153-161 ◽  
Author(s):  
P. Gas ◽  
F.M. d'Heurle

2018 ◽  
Vol 165 (8) ◽  
pp. B3184-B3193 ◽  
Author(s):  
Nouha Labyedh ◽  
Brecht Put ◽  
Abdel-Aziz El Mel ◽  
Philippe M. Vereecken

2017 ◽  
Author(s):  
Vantari Siva ◽  
Debi P. Datta ◽  
S. Prusty ◽  
Pratap K. Sahoo

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