scholarly journals Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

2007 ◽  
Vol 78 (6) ◽  
pp. 063702 ◽  
Author(s):  
K. Lai ◽  
M. B. Ji ◽  
N. Leindecker ◽  
M. A. Kelly ◽  
Z. X. Shen
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Atomic Force ◽  
Microwave Microscope ◽  
Near Field Scanning

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning

Development of a “Built-in” Scanning Near Field Microscope Head for an Atomic Force Microscope System and Stress Mapping of an Al2O3/ZrO2 Eutectic Composite

2006 ◽  
Vol 13 (4) ◽  
pp. 269-275 ◽  
Author(s):  
Tatsuo Nakagawa ◽  
Satoshi Fukura ◽  
Munenori Nakai ◽  
Kazumasa Sugiyama ◽  
Ryohei Kokawa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Eutectic Composite ◽  
Atomic Force ◽  
Stress Mapping
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