High resolution structural characterization of giant magnetoresistance structures containing a nano-oxide layer

C. Y. You; A. Cerezo; P. H. Clifton; L. Folks; M. J. Carey; A. K. Petford-Long

doi:10.1063/1.2754364

High resolution structural characterization of giant magnetoresistance structures containing a nano-oxide layer

Applied Physics Letters ◽

10.1063/1.2754364 ◽

2007 ◽

Vol 91 (1) ◽

pp. 011905 ◽

Cited By ~ 13

Author(s):

C. Y. You ◽

A. Cerezo ◽

P. H. Clifton ◽

L. Folks ◽

M. J. Carey ◽

...

Keyword(s):

High Resolution ◽

Oxide Layer ◽

Structural Characterization ◽

Giant Magnetoresistance ◽

Nano Oxide

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Structural characterization of Co100−xFex nano-oxide layer

Journal of Applied Physics ◽

10.1063/1.2165591 ◽

2006 ◽

Vol 99 (8) ◽

pp. 08R703 ◽

Cited By ~ 2

Author(s):

Hiroaki Endo ◽

Masaaki Doi ◽

Naoya Hasegawa ◽

Masashi Sahashi

Keyword(s):

Oxide Layer ◽

Structural Characterization ◽

Nano Oxide

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Structural characterization of trimethylsilyl methyl glycosides derivatives by high-resolution mass spectrometry, linked scans and MIKE experiments

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-008-1915-1 ◽

2008 ◽

Vol 390 (7) ◽

pp. 1853-1860 ◽

Cited By ~ 2

Author(s):

Corinne Loutelier-Bourhis ◽

Muriel Bardor ◽

Catherine M. Lange

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Structural Characterization ◽

High Resolution Mass Spectrometry ◽

High Resolution Mass ◽

Resolution Mass

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Structural characterization of polypyrrole in the solid state by high resolution 15N NMR spectroscopy combined with quantum chemistry

Journal of Molecular Structure ◽

10.1016/0022-2860(92)80015-a ◽

1992 ◽

Vol 269 (1-2) ◽

pp. 183-195 ◽

Cited By ~ 25

Author(s):

Mizuyo Kikuchi ◽

Hiromichi Kurosu ◽

Isao Ando

Keyword(s):

Solid State ◽

Nmr Spectroscopy ◽

High Resolution ◽

Quantum Chemistry ◽

Structural Characterization ◽

15N Nmr ◽

15N Nmr Spectroscopy

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High-Resolution X-Ray Diffraction Techniques for Structural Characterization of Silicon and Other Advanced Materials

Crystal Growth Technology ◽

10.1002/0470871687.ch5 ◽

2004 ◽

pp. 93-114

Author(s):

Krishan Lal

Keyword(s):

High Resolution ◽

Structural Characterization ◽

Advanced Materials ◽

X Ray Diffraction ◽

X Ray

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Structural Characterization of Zeolites by High Resolution Magic-Angle-Spinning Solid State 29Si-NMR Spectroscopy

Zeolites: Science and Technology ◽

10.1007/978-94-009-6128-9_7 ◽

1984 ◽

pp. 193-210 ◽

Cited By ~ 5

Author(s):

Zelimir Gabelica ◽

Janos B. Nagy ◽

Philippe Bodart ◽

Guy Debras ◽

Eric G. Derouane ◽

...

Keyword(s):

Solid State ◽

Nmr Spectroscopy ◽

High Resolution ◽

Structural Characterization ◽

Magic Angle Spinning ◽

Magic Angle ◽

29Si Nmr ◽

Angle Spinning ◽

29Si Nmr Spectroscopy

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Detection and structural characterization of the metabolites of dihydroresveratrol in rats by liquid chromatography coupled to high resolution tandem mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8991 ◽

2020 ◽

Author(s):

Qiang‐Guo Ji ◽

Ming‐Hua Ma ◽

Xue‐Mei Hu ◽

Yi‐Jun Zhang ◽

Xiao‐Hong Xu ◽

...

Keyword(s):

Mass Spectrometry ◽

Liquid Chromatography ◽

High Resolution ◽

Tandem Mass Spectrometry ◽

Structural Characterization ◽

Tandem Mass

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Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.129.99 ◽

1993 ◽

Vol 129 ◽

pp. 99-118

Author(s):

C.L. Jia ◽

B. Kabius ◽

K. Urban

Keyword(s):

Thin Films ◽

High Resolution ◽

Structural Characterization ◽

Step Edge ◽

Resolution Electron

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Structural characterization of plasma-doped silicon by high resolution x-ray diffraction

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587334 ◽

1994 ◽

Vol 12 (2) ◽

pp. 951 ◽

Cited By ~ 14

Author(s):

D. L. Chapek

Keyword(s):

High Resolution ◽

Structural Characterization ◽

X Ray Diffraction ◽

X Ray ◽

Doped Silicon

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Structural Characterization of the Si(111)-CaF2Interface by High-Resolution Transmission Electron Microscopy

Physical Review Letters ◽

10.1103/physrevlett.61.2973.2 ◽

1988 ◽

Vol 61 (26) ◽

pp. 2973-2973

Author(s):

R. M. Tromp ◽

F. K. LeGoues ◽

W. Krakow ◽

L. J. Schowalter

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Structural Characterization ◽

Transmission Electron

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High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies

Chemistry of Materials ◽

10.1021/cm4004799 ◽

2013 ◽

Vol 25 (11) ◽

pp. 2227-2242 ◽

Cited By ~ 27

Author(s):

Boris Bouchevreau ◽

Charlotte Martineau ◽

Caroline Mellot-Draznieks ◽

Alain Tuel ◽

Matthew R. Suchomel ◽

...

Keyword(s):

High Resolution ◽

Powder Diffraction ◽

Structural Characterization ◽

Synchrotron Powder Diffraction

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