Photoelectron spectroscopic investigation of nitrogen chemical states in ZnO: (N,Ga) thin films

2008 ◽  
Vol 103 (10) ◽  
pp. 103704 ◽  
Author(s):  
H. Wang ◽  
H. P. Ho ◽  
J. B. Xu
Keyword(s):  
Thin Films ◽  
Spectroscopic Investigation ◽  
Chemical States

Direct Correlations of Grain Boundary Potentials to Chemical States and Dielectric Properties of Doped CaCu3Ti4O12 Thin Films

2018 ◽  
Vol 10 (18) ◽  
pp. 16203-16209 ◽  
Author(s):  
Ahra Cho ◽  
Chan Su Han ◽  
Meenjoo Kang ◽  
Wooseok Choi ◽  
Jihwan Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Grain Boundary ◽  
Chemical States

Adhesion Between Polyimide Films and A12O3 Substrate

1995 ◽  
Vol 385 ◽  
Author(s):  
Y. Nakamura ◽  
Y. Suzuki ◽  
Y. Watanabe ◽  
S. Hirayama
Keyword(s):  
Thin Films ◽  
Adhesive Strength ◽  
Oxygen Plasma ◽  
Alumina Substrate ◽  
Polyimide Films ◽  
Pull Test ◽  
Chemical States ◽  
Cure Temperature

ABSTRACTThe adhesive strength of polyimide thin films on an alumina substrate has been studied by the pull test. Polyimide thin films were cured at various temperatures from 300 to 400°C, followed by etching in an oxygen plasma for 3 min. After metallization with chromium and copper, the pull test was carried out. It is found that the adhesive strength increases with an increase of the cure temperature. However the strength deteriorates noticeably at the cure temperature of 400°C. A possible reason for this is the variation of chemical states in the polyimide thin films.

Laser spectroscopic investigation of lithium doping effect on luminescence enhancement in YVO4:Eu3+ thin films

2009 ◽  
Vol 479 (1-3) ◽  
pp. 65-69 ◽  
Author(s):  
Kyoung Hyuk Jang ◽  
Eun Sik Kim ◽  
Liang Shi ◽  
Jung Hyun Jeong ◽  
Hyo Jin Seo
Keyword(s):  
Thin Films ◽  
Spectroscopic Investigation ◽  
Doping Effect ◽  
Luminescence Enhancement ◽  
Lithium Doping ◽  
Laser Spectroscopic

In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) tri-layer thin films

2018 ◽  
Vol 453 ◽  
pp. 365-372 ◽  
Author(s):  
Xiaoli Zhu ◽  
Matteo Todeschini ◽  
Alice Bastos da Silva Fanta ◽  
Lintao Liu ◽  
Flemming Jensen ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystal Orientation ◽  
Orientation Mapping ◽  
Chemical States ◽  
Crystal Orientation Mapping

COMPOSITES OF THE TITANIA THIN FILMS IMPLANTED BY Ge AND Si

2011 ◽  
Vol 25 (12) ◽  
pp. 1629-1635 ◽  
Author(s):  
YANJUN ZHOU ◽  
FANG HE ◽  
YUAN HUANG ◽  
YIZAO WAN ◽  
YULIN WANG
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Photoelectron Spectroscopy ◽  
Quartz Substrate ◽  
Visible Region ◽  
Silicon Oxides ◽  
Practical Applications ◽  
Chemical States ◽  
Titanium Dioxide Thin Films ◽  
Implantation Method

By using reactive magnetron sputtering system, titanium dioxide thin films were fabricated onto quartz substrate, and then modified by Ge and Si atoms that were introduced with ion implantation method. XRD, AFM, XPS, and UV-vis were used to characterize these films, and X-ray photoelectron spectroscopy (XPS) was adopted to examine the atomic chemical states of implanted titanium dioxide thin films. The results show that there are Ge and silicon oxides precipitations in TiO 2 matrices. The implanted Ge + Si thin film exhibits an intense absorption band within visible region, which will further benefit its practical applications.

Spectroscopic investigation of elastic and magnetoelastic properties of CoFeB thin films

2016 ◽  
Vol 49 (14) ◽  
pp. 145003 ◽  
Author(s):  
M Gueye ◽  
F Zighem ◽  
M Belmeguenai ◽  
M S Gabor ◽  
C Tiusan ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Investigation ◽  
Magnetoelastic Properties

Study of reactions between HfO2 and Si in thin films with precise identification of chemical states by XPS

2011 ◽  
Vol 257 (8) ◽  
pp. 3440-3445 ◽  
Author(s):  
H. Wang ◽  
P. Wu ◽  
X.F. Li ◽  
S. Chen ◽  
S.P. Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Precise Identification ◽  
Chemical States

Study on Preparation and Optical Absorption of Ge Doped TiO2 Composite Thin Films by Sol-Gel Method

2011 ◽  
Vol 299-300 ◽  
pp. 558-561 ◽  
Author(s):  
Yan Jun Zhou ◽  
Fang He ◽  
Jin Gang Qi ◽  
Yu Lin Wang
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Sol Gel ◽  
Visible Region ◽  
Diffraction Peak ◽  
Composite Thin Films ◽  
Gel Method ◽  
Sol Gel Method ◽  
Chemical States ◽  
Quartz Substrates

By using the sol-gel method, TiO2 thin films and Ge doped TiO2 composite thin films were fabricated onto quartz substrates. XRD, XPS and UV-vis were used to characterize the phase structure, the atomic chemical states and optical absorption of these composite TiO2 thin films. XRD results indicate that diffraction peak of anatase is observed in samples. XPS result reveals that there is Ge crystal in Ge doped films which were prepared by sol-gel method, and Ge exists as elemental Ge and GeO2 in the films. The composite TiO2 thin films by sol-gel method exhibits the absorption shift to visible region due to Ge doped TiO2 thin films.

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