Influence of fine roughness of insulator surface on threshold voltage stability of organic field-effect transistors

2008 ◽  
Vol 93 (3) ◽  
pp. 033308 ◽  
Author(s):  
Kouji Suemori ◽  
Sei Uemura ◽  
Manabu Yoshida ◽  
Satoshi Hoshino ◽  
Noriyuki Takada ◽  
...  
2007 ◽  
Vol 91 (19) ◽  
pp. 192112 ◽  
Author(s):  
Kouji Suemori ◽  
Sei Uemura ◽  
Manabu Yoshida ◽  
Satoshi Hoshino ◽  
Noriyuki Takada ◽  
...  

2011 ◽  
Vol 14 ◽  
pp. 217-220
Author(s):  
Kouji Suemori ◽  
Misuzu Taniguchi ◽  
Sei Uemura ◽  
Manabu Yoshida ◽  
Satoshi Hoshino ◽  
...  

2008 ◽  
Vol 1 ◽  
pp. 061801 ◽  
Author(s):  
Kouji Suemori ◽  
Misuzu Taniguchi ◽  
Sei Uemura ◽  
Manabu Yoshida ◽  
Satoshi Hoshino ◽  
...  

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