An ultrahigh-vacuum apparatus for resonant diffraction experiments using soft x rays (hν=300–2000 eV)

2009 ◽  
Vol 80 (2) ◽  
pp. 023905 ◽  
Author(s):  
T. Takeuchi ◽  
A. Chainani ◽  
Y. Takata ◽  
Y. Tanaka ◽  
M. Oura ◽  
...  
2016 ◽  
Vol 23 (5) ◽  
pp. 1245-1253 ◽  
Author(s):  
Chris Nicklin ◽  
Tom Arnold ◽  
Jonathan Rawle ◽  
Adam Warne

Beamline I07 at Diamond Light Source is dedicated to the study of the structure of surfaces and interfaces for a wide range of sample types, from soft matter to ultrahigh vacuum. The beamline operates in the energy range 8–30 keV and has two endstations. The first houses a 2+3 diffractometer, which acts as a versatile platform for grazing-incidence techniques including surface X-ray diffraction, grazing-incidence small- (and wide-) angle X-ray scattering, X-ray reflectivity and grazing-incidence X-ray diffraction. A method for deflecting the X-rays (a double-crystal deflector) has been designed and incorporated into this endstation, extending the surfaces that can be studied to include structures formed on liquid surfaces or at liquid–liquid interfaces. The second experimental hutch contains a similar diffractometer with a large environmental chamber mounted on it, dedicated toin situultrahigh-vacuum studies. It houses a range of complementary surface science equipment including a scanning tunnelling microscope, low-energy electron diffraction and X-ray photoelectron spectroscopy ensuring that correlations between the different techniques can be performed on the same sample, in the same chamber. This endstation allows accurate determination of well ordered structures, measurement of growth behaviour during molecular beam epitaxy and has also been used to measure coherent X-ray diffraction from nanoparticles during alloying.


1998 ◽  
Vol 5 (3) ◽  
pp. 1029-1031
Author(s):  
Munehiro Sugiyama ◽  
Satoshi Maeyama

An ultrahigh-vacuum goniometer was developed for in situ X-ray standing-wave (XSW) analysis of semiconductor surfaces prepared by molecular-beam epitaxy (MBE). Although two ultrahigh-vacuum motors for χ and φ rotating axes are inside the analysis chamber, low-energy photoelectrons can still be collected as the magnetic field is sufficiently suppressed by using metal shields. Furthermore, the sample can be annealed at temperatures higher than 870 K on the goniometer in the analysis chamber. This goniometer is used at beamline 1A (BL-1A) at the Photon Factory, where both monochromated soft X-rays and UV radiation are available. This analysis system was shown to be suitable not only for in situ soft-XSW and X-ray absorption near-edge structure (XANES) studies but also for synchrotron radiation photoelectron spectroscopy (SRPES) studies. The annealing effects on an S-adsorbed GaAs(001) surface could be studied by SRPES, XANES and XSW using this new goniometer.


2005 ◽  
Vol 76 (2) ◽  
pp. 023904 ◽  
Author(s):  
L. Bruschi ◽  
A. Carlin ◽  
F. Buatier de Mongeot ◽  
F. dalla Longa ◽  
L. Stringher ◽  
...  

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