scholarly journals Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces

2009 ◽  
Vol 105 (7) ◽  
pp. 074906 ◽  
Author(s):  
F. Meirer ◽  
G. Pepponi ◽  
C. Streli ◽  
P. Wobrauschek ◽  
N. Zoeger
2009 ◽  
Vol 42 (6) ◽  
pp. 1158-1164 ◽  
Author(s):  
Narcizo M. Souza-Neto ◽  
Aline Y. Ramos ◽  
Hélio C. N. Tolentino ◽  
Alessandro Martins ◽  
Antonio D. Santos

A method of using X-ray absorption spectroscopy together with resolved grazing-incidence geometry for depth profiling of atomic, electronic or chemical local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.


ACS Omega ◽  
2018 ◽  
Vol 3 (11) ◽  
pp. 14981-14985 ◽  
Author(s):  
Rui Yang ◽  
David J. Morris ◽  
Tatsuya Higaki ◽  
Matthew J. Ward ◽  
Rongchao Jin ◽  
...  

2012 ◽  
pp. 2435-2435
Author(s):  
Yimei Zhu ◽  
Hiromi Inada ◽  
Achim Hartschuh ◽  
Li Shi ◽  
Ada Della Pia ◽  
...  

2020 ◽  
Vol 109 (6) ◽  
pp. 2095-2099
Author(s):  
Masataka Ito ◽  
Rika Shiba ◽  
Hironori Suzuki ◽  
Shuji Noguchi

2011 ◽  
Vol 18 (2) ◽  
pp. 238-244 ◽  
Author(s):  
Florian Meirer ◽  
Bernhard Pemmer ◽  
Giancarlo Pepponi ◽  
Norbert Zoeger ◽  
Peter Wobrauschek ◽  
...  

2010 ◽  
Author(s):  
I. D. Feranchuk ◽  
A. I. Benediktovitch ◽  
Remo Ruffini ◽  
Gregory Vereshchagin

2011 ◽  
Vol 681 ◽  
pp. 393-398 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmanski ◽  
Nacer Zazi ◽  
Jean Paul Chopart ◽  
Alain Lodini ◽  
...  

Grazing incidence geometry, called MGID-sin2y, was applied to measure surface stresses in very thin layers (depth of a few mm) of Al-Mg alloy samples subjected to different thermal and mechanical treatments. The Göbel mirror was used to parallelize the incident X-ray beam. Perfect collimation of the beam significantly increases accuracy of determined peak position and consequently allows to measure low stresses in surface layers.


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