Photoabsorption cross section of C70 thin films from visible to vacuum ultraviolet

2009 ◽  
Vol 130 (23) ◽  
pp. 234510 ◽  
Author(s):  
H. Yagi ◽  
K. Nakajima ◽  
K. R. Koswattage ◽  
K. Nakagawa ◽  
H. Katayanagi ◽  
...  
Keyword(s):  
Thin Films ◽  
Cross Section ◽  
Vacuum Ultraviolet ◽  
Photoabsorption Cross Section

Photoabsorption cross section of C60 thin films from the visible to vacuum ultraviolet

Carbon ◽  
2009 ◽  
Vol 47 (4) ◽  
pp. 1152-1157 ◽  
Author(s):  
H. Yagi ◽  
K. Nakajima ◽  
K.R. Koswattage ◽  
K. Nakagawa ◽  
C. Huang ◽  
...  
Keyword(s):  
Thin Films ◽  
Cross Section ◽  
Vacuum Ultraviolet ◽  
Photoabsorption Cross Section

COMPARATIVE VERY-HIGH-RESOLUTION VUV SPECTROSCOPY: LASER SPECTROSCOPY OF O2

2002 ◽  
Vol 09 (01) ◽  
pp. 31-38 ◽  
Author(s):  
B. R. LEWIS ◽  
S. T. GIBSON ◽  
K. G. H. BALDWIN ◽  
P. M. DOOLEY ◽  
K. WARING
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
Vacuum Ultraviolet ◽  
Experimental Studies ◽  
Resolving Power ◽  
Photoabsorption Cross Section ◽  
Synchrotron Source ◽  
Narrow Bandwidth ◽  
Experimental Resolution ◽  
Very High

Despite their importance to the photochemistry of the terrestrial atmosphere, and many experimental studies, previous characterization of the Schumann–Runge (SR) bands of O 2, [Formula: see text] (1750–2050 Å) has been limited by poor experimental resolution. In addition, our understanding of the SR spectrum is incomplete, many rovibrational transitions in the perturbed region of the spectrum [B(v > 15)] remaining unassigned. We review new very-high-resolution measurements of the O 2 photoabsorption cross section in the SR bands. Tunable, narrow-bandwidth background vacuum-ultraviolet (VUV) radiation for the measurements (~ 7 × 105 resolving power) was generated by the two-photon-resonant difference-frequency four-wave mixing in Xe of excimer-pumped dye-laser radiation. With the aid of these cross-section measurements, rovibrational and line-shape analyses have led to new insights into the molecular structure and predissociation dynamics of O 2. The current VUV laser-spectroscopic measurements are shown to compare favourably with results from two other very-high-resolution experimental techniques, namely laser-induced fluorescence spectroscopy and VUV Fourier-transform spectroscopy, the latter performed using a synchrotron source.

TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

2010 ◽  
Vol 16 (6) ◽  
pp. 662-669 ◽  
Author(s):  
S. Simões ◽  
F. Viana ◽  
A.S. Ramos ◽  
M.T. Vieira ◽  
M.F. Vieira
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Cross Section ◽  
Ion Beam ◽  
Microstructural Characterization ◽  
Multilayer Thin Films ◽  
Tem Analysis ◽  
Plan View ◽  
Transmission Electron

AbstractReactive multilayer thin films that undergo highly exothermic reactions are attractive choices for applications in ignition, propulsion, and joining systems. Ni/Al reactive multilayer thin films were deposited by dc magnetron sputtering with a period of 14 nm. The microstructure of the as-deposited and heat-treated Ni/Al multilayers was studied by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in plan view and in cross section. The cross-section samples for TEM and STEM were prepared by focused ion beam lift-out technique. TEM analysis indicates that the as-deposited samples were composed of Ni and Al. High-resolution TEM images reveal the presence of NiAl in small localized regions. Microstructural characterization shows that heat treating at 450 and 700°C transforms the Ni/Al multilayered structure into equiaxed NiAl fine grains.

The absolute N2 K-photoabsorption cross section up to hω = 450 eV

1978 ◽  
Vol 58 (2) ◽  
pp. 263-266 ◽  
Author(s):  
H. Petersen ◽  
A. Bianconi ◽  
F.C. Brown ◽  
R.Z. Bachrach
Keyword(s):  
Cross Section ◽  
Photoabsorption Cross Section ◽  
The Absolute

L2 calculation of the total photoabsorption cross section of H− from threshold to 50 eV

1976 ◽  
Vol 37 (2) ◽  
pp. 212-216 ◽  
Author(s):  
John T. Broad ◽  
William P. Reinhardt
Keyword(s):  
Cross Section ◽  
Photoabsorption Cross Section

Surface modification of polymeric thin films with vacuum ultraviolet light

2008 ◽  
Vol 40 (3-4) ◽  
pp. 400-403 ◽  
Author(s):  
E. Sarantopoulou ◽  
J. Kovač ◽  
Z. Kollia ◽  
I. Raptis ◽  
S. Kobe ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Modification ◽  
Ultraviolet Light ◽  
Vacuum Ultraviolet ◽  
Polymeric Thin Films

Microstructure Evolution of Epitaxial (Ba, Sr) TiO3/ (001) HgO Thin Films

1994 ◽  
Vol 361 ◽  
Author(s):  
V.A. Alyoshin ◽  
E.V. Sviridov ◽  
V.I.M. Hukhortov ◽  
I.H. Zakharchenko ◽  
V.P. Dudkevich
Keyword(s):  
Thin Films ◽  
Cross Section ◽  
Microstructure Evolution ◽  
Three Dimensional ◽  
Gas Pressure ◽  
Smooth Surfaces ◽  
Two Dimensional ◽  
Surface Versus ◽  
Deposition Conditions

ABSTRACTSurface and cross-section relief evolution of ferroelectric epitaxial (Ba,Sr)TiO3 films rf-sputtered on (001) HgO crystal cle-avage surface versus the oxygen worKing gas pressure P and subst-rate temperature T were studied. Specific features of both three-dimensional and two-dimensional epitaxy mechanisms corresponding to various deposition conditions were revealed. Difference between low and high P-T-value 3D epitaxy was established. The deposition of films with mirror-smooth surfaces and perfect interfaces is shown to be possible.

Photoabsorption cross section of negatively charged alkali-metal clusters

1993 ◽  
Vol 47 (11) ◽  
pp. 6667-6671 ◽  
Author(s):  
J. M. Pacheco ◽  
W. Ekardt
Keyword(s):  
Alkali Metal ◽  
Cross Section ◽  
Metal Clusters ◽  
Photoabsorption Cross Section ◽  
Alkali Metal Clusters
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