Electrical properties of lead‐zirconate–lead‐titanate ferroelectric thin films and their composition analysis by Auger electron spectroscopy

Journal of Applied Physics ◽

10.1063/1.325455 ◽

1978 ◽

Vol 49 (8) ◽

pp. 4495-4499 ◽

Author(s):

Akira Okada

Keyword(s):

Electrical Properties ◽

Auger Electron Spectroscopy ◽

Lead Titanate ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lead Zirconate ◽

Ferroelectric Thin Films ◽

Composition Analysis

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3911. Electrical properties of lead-zirconate-lead-titanate ferroelectric thin films and their composition analysis by Auger electron spectroscopy. (USA)

Vacuum ◽

10.1016/s0042-207x(79)80799-x ◽

1979 ◽

Vol 29 (4-5) ◽

pp. 190

Keyword(s):

Electrical Properties ◽

Auger Electron Spectroscopy ◽

Lead Titanate ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lead Zirconate ◽

Ferroelectric Thin Films ◽

Composition Analysis

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Compositional analysis of lead titanate thin films by Auger electron spectroscopy and their electrical properties

Thin Solid Films ◽

10.1016/0040-6090(89)90632-9 ◽

1989 ◽

Vol 171 (2) ◽

pp. 251-262 ◽

Author(s):

Soon-Gil Yoon ◽

Hae-Yong Lee ◽

Ho-Gi Kim

Keyword(s):

Electrical Properties ◽

Auger Electron Spectroscopy ◽

Lead Titanate ◽

Electron Spectroscopy ◽

Auger Electron ◽

Compositional Analysis

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A correlation of Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and Rutherford backscattering spectrometry measurements on sputter‐deposited titanium nitride thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574092 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2463-2469 ◽

Author(s):

Brad J. Burrow ◽

Alan E. Morgan ◽

Russell C. Ellwanger

Keyword(s):

Titanium Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

X Ray ◽

Sputter Deposited

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The use of Auger electron spectroscopy to characterize impurity effects in thin films

Thin Solid Films ◽

10.1016/0040-6090(78)90366-8 ◽

1978 ◽

Vol 53 (1) ◽

pp. 29-30 ◽

Author(s):

C.A. Evans ◽

R.J. Blattner

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Impurity Effects

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Studies of the Factors Affecting the Analysis of Thin Films and Surfaces Using Auger Electron Spectroscopy.

10.21236/ada042192 ◽

1977 ◽

Author(s):

J. T. Grant

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Factors Affecting

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Evaluation of I-III-VI 2 Thin Films and Photovoltaic Devices by Auger Electron Spectroscopy

Photovoltaic Solar Energy Conference ◽

10.1007/978-94-009-9840-7_134 ◽

1978 ◽

pp. 1309-1322 ◽

Author(s):

L. L. Kazmerski ◽

R. B. Cooper ◽

F. R. White ◽

D. W. Morton ◽

D. L. Sprague

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Photovoltaic Devices

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Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Journal of the Korean Physical Society ◽

10.3938/jkps.51.925 ◽

2007 ◽

Vol 51 (3) ◽

pp. 925 ◽

Author(s):

John T. Grant

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

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Tungsten silicide composition analysis by Rutherford backscattering spectroscopy, Auger electron spectroscopy, and x-ray photoelectron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581240 ◽

1998 ◽

Vol 16 (3) ◽

pp. 1103-1105 ◽

Author(s):

C. A. Bradbury ◽

D. K. Fillmore

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Composition Analysis ◽

Tungsten Silicide ◽

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Nonlinear composition dependence of x-ray photoelectron spectroscopy and Auger electron spectroscopy features in plasma-deposited zirconium silicate alloy thin films

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1493788 ◽

2002 ◽

Vol 20 (4) ◽

pp. 1748 ◽

Author(s):

G. B. Rayner ◽

D. Kang ◽

Y. Zhang ◽

G. Lucovsky

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Composition Dependence ◽

X Ray ◽

Zirconium Silicate

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Characterization of Oxygen Vacancies in SrTiO3 Thin Films by Auger Electron Spectroscopy and Its Application to Leakage Current Reduction of Ru/SrTiO3/Ru Capacitor

10.7567/ssdm.2001.b-10-3 ◽

2001 ◽

Author(s):

S. Niwa ◽

S. Yamazaki ◽

M. Kiyotoshi ◽

J. Nakahira ◽

M. Nakabayashi ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Leakage Current ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxygen Vacancies ◽

Current Reduction

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