Classical and Thermodynamically Consistent Non-local Formulations for Ductile Damage: Comparison of Approaches

2010 ◽  
Author(s):  
José M. A. César de Sá ◽  
Filipe X. C. Andrade ◽  
Francisco M. Andrade Pires ◽  
F. Barlat ◽  
Y. H. Moon ◽  
...  
Keyword(s):  
2003 ◽  
Vol 26 ◽  
pp. 219-229 ◽  
Author(s):  
F. Reusch ◽  
B. Svendsen ◽  
D. Klingbeil

2013 ◽  
Vol 23 (2) ◽  
pp. 261-296 ◽  
Author(s):  
FXC Andrade ◽  
JMA César de Sá ◽  
FM Andrade Pires

Author(s):  
Frederick Reusch ◽  
Christian Hortig ◽  
Bob Svendsen

The purpose of the current work is the application of a recent nonlocal extension (Reusch, F., Svendsen, B., and Klingbeil, D., 2003, “Local and Non-Local Gurson-Based Ductile Damage and Failure Modelling at Large Deformation,” Eur. J. Mech. A∕Solids, 22, pp. 779–792; “A Non-Local Extension of Gurson-Based Ductile Damage Modeling,” Comput. Mater. Sci., 26, pp. 219–229) of the Gurson–Needleman–Tvergaard (GTN) model (Needleman, A., and Tvergaard, V., 1984, “An Analysis of Ductile Rupture in Notched Bars,” J. Mech Phys. Solids, 32, pp. 461–490) to the simulation of ductile damage and failure processes in metal matrix composites at the microstructural level. The extended model is based on the treatment of void coalescence as a nonlocal process. In particular, we compare the predictions of the local with GTN model with those of the nonlocal extension for ductile crack initiation in ideal and real Al–SiC metal matrix microstructures. As shown by the current results for metal matrix composites and as expected, the simulation results based on the local GTN model for both the structural response and predicted crack path at the microstructural level in metal matrix composites are strongly mesh-dependent. On the other hand, those based on the current nonlocal void-coalescence modeling approach are mesh-independent. This correlates with the fact that, in contrast to the local approach, the predictions of the nonlocal approach for the crack propagation path in the real Al–SiC metal matrix composite microstructure considered here agree well with the experimentally determined path.


2009 ◽  
Vol 2 (S1) ◽  
pp. 923-926 ◽  
Author(s):  
H. R. Javani ◽  
R. H. J. Peerlings ◽  
M. G. D. Geers

PAMM ◽  
2003 ◽  
Vol 3 (1) ◽  
pp. 232-235 ◽  
Author(s):  
Bob Svendsen ◽  
Frederik Reusch ◽  
Dietmar Klingbeil

2016 ◽  
Vol 734 ◽  
pp. 032059
Author(s):  
Steffen Beese ◽  
Stefan Loehnert ◽  
Peter Wriggers

Author(s):  
Zhifeng Shao

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as


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