Interface and growth‐mode characterization of Ce/Fe and CeH≊2/Fe multilayers by x‐ray diffraction and Rutherford backscattering spectroscopy

1993 ◽  
Vol 74 (2) ◽  
pp. 1040-1045 ◽  
Author(s):  
F. Klose ◽  
M. Steins ◽  
T. Kacsich ◽  
W. Felsch
Keyword(s):  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Growth Mode ◽  
X Ray Diffraction ◽  
X Ray

Structural characterization of AlGaN/GaN superlattices by x-ray diffraction and Rutherford backscattering

2006 ◽  
Vol 40 (3) ◽  
pp. 137-143 ◽  
Author(s):  
Shengqiang Zhou ◽  
M.F. Wu ◽  
S.D. Yao ◽  
B.S. Zhang ◽  
H. Yang
Keyword(s):  
Structural Characterization ◽  
Rutherford Backscattering ◽  
X Ray Diffraction ◽  
X Ray

Thin-film reactions of Au with Ti, Zr, V, and Nb

1987 ◽  
Vol 2 (1) ◽  
pp. 28-34 ◽  
Author(s):  
E. G. Colgan ◽  
J. W. Mayer
Keyword(s):  
Thin Film ◽  
Phase Diagrams ◽  
Intermetallic Phases ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray

The thin-film interactions of Au with Ti, Zr, V, and Nb have been investigated between 350C and 700°C with Rutherford backscattering spectroscopy (RBS) and x-ray diffraction (XRD). Initially the most Au-rich phase is formed, except. with V, and it is followed sequentially by the more metal-rich ones in an increasingly layer-by-layer fashion. For Au reactions on Ti and Nb, all the intermetallic phases on the phase diagrams were observed. In the formation of Au4Ti, Au is the dominant moving species.

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