I‐Vcharacteristics of electron‐cyclotron‐resonance plasma‐enhanced chemical‐vapor‐deposition silicon nitride thin films

1994 ◽  
Vol 75 (2) ◽  
pp. 979-984 ◽  
Author(s):  
Yoo‐Chan Jeon ◽  
Ho‐Young Lee ◽  
Seung‐Ki Joo
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