Silicon nitride thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition

1999 ◽  
Vol 17 (2) ◽  
pp. 433-444 ◽  
Author(s):  
M. Lapeyrade ◽  
M. P. Besland ◽  
C. Meva’a ◽  
A. Sibaï ◽  
G. Hollinger
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