Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors
2014 ◽
Vol 3
(5)
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pp. Q95-Q98
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Keyword(s):
2012 ◽
Vol 43
(1)
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pp. 1133-1136
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2021 ◽
Vol 68
(9)
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pp. 4450-4454
Keyword(s):
2019 ◽
Vol 10
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pp. 1125-1130
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2013 ◽
Vol 52
(4R)
◽
pp. 041701
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2015 ◽
Vol 3
(14)
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pp. 3438-3444
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Keyword(s):
2002 ◽
Vol 41
(Part 2, No. 10B)
◽
pp. L1164-L1166
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Keyword(s):
2014 ◽
Vol 35
(9)
◽
pp. 930-932
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Keyword(s):
2017 ◽
Vol 50
(49)
◽
pp. 495109
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