Optical and structural characterization of thermal oxidation effects of erbium thin films deposited by electron beam on silicon

Electrical, optical, and structural characterization of p-type N-doped SnO thin films prepared by thermal oxidation of sputtered SnNx thin films

Surface and Interface Analysis ◽

10.1002/sia.6313 ◽

2017 ◽

Vol 49 (12) ◽

pp. 1225-1231 ◽

Cited By ~ 2

Author(s):

A. Garzon-Fontecha ◽

W. De La Cruz ◽

M. Quevedo

Keyword(s):

Thin Films ◽

Thermal Oxidation ◽

P Type

Structural characterization of superconducting Y-Ba-Cu-O thin films, prepared by pulsed electron beam evaporation

Journal of Crystal Growth ◽

10.1016/0022-0248(96)00054-1 ◽

1996 ◽

Vol 166 (1-4) ◽

pp. 848-853 ◽

Cited By ~ 2

Author(s):

S. Christiansen ◽

F. Mücke ◽

J. Markl ◽

W. Dorsch ◽

R. Stark ◽

...

Keyword(s):

Thin Films ◽

Electron Beam ◽

Electron Beam Evaporation ◽

Pulsed Electron Beam

GROWTH AND MICRO STRUCTURAL CHARACTERIZATION OF IN2O3 THIN FILMS PREPARED BY ELECTRON BEAM EVAPORATION TECHNIQUE

International Journal of Research in Engineering and Technology ◽

10.15623/ijret.2015.0419002 ◽

2015 ◽

Vol 04 (19) ◽

pp. 4-8

Author(s):

Veeraswamy.Y .

Keyword(s):

Thin Films ◽

Electron Beam ◽

Electron Beam Evaporation ◽

Electron Beam Evaporation Technique ◽

Evaporation Technique

Structural Characterization of Pt-Bi Thin Films Deposited by Electron Beam Evaporation

Microscopy and Microanalysis ◽

10.1017/s1431927611008105 ◽

2011 ◽

Vol 17 (S2) ◽

pp. 1446-1447

Author(s):

X Li ◽

P Kharel ◽

V Shah ◽

D Sellmyer

Keyword(s):

Thin Films ◽

Electron Beam ◽

Electron Beam Evaporation

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

Sensors and Actuators B Chemical ◽

10.1016/j.snb.2005.03.080 ◽

2005 ◽

Vol 109 (1) ◽

pp. 47-51 ◽

Cited By ~ 4

Author(s):

I. Alessandri ◽

E. Comini ◽

E. Bontempi ◽

G. Sberveglieri ◽

L.E. Depero

Keyword(s):

Thin Films ◽

Rf Sputtering ◽

Tio2 Thin Films ◽

Titanium Target

Structural Characterization of Amorphous Carbon Nitride Thin Films Prepared by Pulsed Laser Deposition

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.206-213.531 ◽

2001 ◽

Vol 206-213 ◽

pp. 531-534

Author(s):

Yoshifumi Aoi ◽

Kunio Sakurada ◽

Kojiro Ono ◽

Eiji Kamijo

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Amorphous Carbon ◽

Carbon Nitride ◽

Pulsed Laser ◽

Laser Deposition ◽

Amorphous Carbon Nitride

2010 7th International Conference on Electrical Engineering Computing Science and Automatic Control ◽

Electrical characterization of Pd-PdO nanocomposites and PdO thin films prepared by thermal oxidation of Pd

10.1109/iceee.2010.5608620 ◽

2010 ◽

Author(s):

O. Garcia-Serrano ◽

R. Pena-Sierra ◽

G. Romero-Paredes

Keyword(s):

Thin Films ◽

Thermal Oxidation ◽

Electrical Characterization

Structural characterization of electrodeposited EuSe thin films

Materials Research Bulletin ◽

10.1016/s0025-5408(01)00756-5 ◽

2001 ◽

Vol 36 (15) ◽

pp. 2613-2626 ◽

Cited By ~ 4

Author(s):

N.S Gaikwad ◽

C.H Bhosale

Keyword(s):

Thin Films ◽

Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN/6H-SiC(0001) Thin Films

Materials Science Forum ◽

10.4028/www.scientific.net/msf.264-268.1225 ◽

1998 ◽

Vol 264-268 ◽

pp. 1225-1228 ◽

Cited By ~ 4

Author(s):

Sukkaneste Tungasmita ◽

Jens Birch ◽

L. Hultman ◽

Erik Janzén ◽

J.-E. Sundgren

Keyword(s):

Thin Films ◽

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

Applied Surface Science ◽

10.1016/0169-4332(93)90678-5 ◽

1993 ◽

Vol 65-66 ◽

pp. 313-318 ◽

Cited By ~ 8

Author(s):

M. Di Giulio ◽

M.C. Nicotra ◽

M. Re ◽

R. Rella ◽

P. Siciliano

Keyword(s):

Thin Films ◽

Optical Absorption ◽