Role of barrier structure in current collapse of AlGaN/GaN high electron mobility transistors
2019 ◽
Vol 217
(7)
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pp. 1900762
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2011 ◽
Vol 50
(6)
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pp. 061001
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2010 ◽
Vol 54
(11)
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pp. 1430-1433
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2011 ◽