Photoelectrochemical oxidation-treated AlGaN/GaN metal-oxide-semiconductor high-electron mobility transistors with oxidized layer/Ta2O5/Al2O3 gate dielectric stack
2012 ◽
Vol 33
(7)
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pp. 997-999
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2011 ◽
Vol 50
(4)
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pp. 04DF03
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2008 ◽
Vol 29
(4)
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pp. 284-286
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