Mechanical stress effects on Pb(Zr,Ti)O3 thin-film ferroelectric capacitors embedded in a standard complementary metal-oxide-semiconductor process
2017 ◽
Vol 9
(15)
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pp. 13262-13268
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2008 ◽
Vol 47
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pp. 1147-1151
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2002 ◽
Vol 49
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pp. 1993-2000
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2008 ◽
Vol 47
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pp. 3091-3094
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2011 ◽
Vol 50
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pp. 04DE05
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