On the origin of the two-dimensional electron gas at AlGaN/GaN heterojunctions and its influence on recessed-gate metal-insulator-semiconductor high electron mobility transistors

2014 ◽  
Vol 116 (13) ◽  
pp. 134506 ◽  
Author(s):  
B. Bakeroot ◽  
S. You ◽  
T.-L. Wu ◽  
J. Hu ◽  
M. Van Hove ◽  
...  
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