In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
2008 ◽
2011 ◽
Vol 2011
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pp. 1-7
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1999 ◽
Vol 17
(4)
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pp. 1413
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1998 ◽
Vol 37
(Part 1, No. 3B)
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pp. 1584-1590
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2010 ◽
Vol 7
(11-12)
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pp. 2671-2674
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2002 ◽
Vol 41
(Part 1, No. 4B)
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pp. 2675-2678
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1994 ◽
Vol 12
(6)
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pp. 3619
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