Probing depth dependent structure and magnetic properties of thin films using polarized neutron reflectivity

2015 ◽  
Author(s):  
Surendra Singh ◽  
Saibal Basu
Nanomaterials ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 851
Author(s):  
Dmitry Gorkov ◽  
Boris P. Toperverg ◽  
Hartmut Zabel

Traditionally, neutron scattering is an essential method for the analysis of spin structures and spin excitations in bulk materials. Over the last 30 years, polarized neutron scattering in terms of reflectometry has also contributed largely to the analysis of magnetic thin films and magnetic multilayers. More recently it has been shown that polarized neutron reflectivity is, in addition, a suitable tool for the study of thin films laterally patterned with magnetic stripes or islands. We provide a brief overview of the fundamental properties of polarized neutron reflectivity, considering different domain states, domain fluctuations, and different domain sizes with respect to the neutron coherence volume. The discussion is exemplified by a set of simulated reflectivities assuming either complete polarization and polarization analysis, or a reduced form of polarized neutron reflectivity without polarization analysis. Furthermore, we emphasize the importance of the neutron coherence volume for the interpretation of specular and off-specular intensity maps, in particular when studying laterally non-homogeneous magnetic films. Finally, experimental results, fits, and simulations are shown for specular and off-specular scattering from a magnetic film that has been lithographically patterned into a periodic stripe array. These experiments demonstrate the different and mutually complementary information that can be gained when orienting the stripe array parallel or perpendicular to the scattering plane.


2018 ◽  
Vol 2 (4) ◽  
Author(s):  
Xiaofang Zhai ◽  
Alexander J. Grutter ◽  
Yu Yun ◽  
Zhangzhang Cui ◽  
Yalin Lu

2004 ◽  
Vol 70 (14) ◽  
Author(s):  
V. N. Gladilin ◽  
V. M. Fomin ◽  
J. T. Devreese ◽  
J. Swerts ◽  
K. Temst ◽  
...  

2000 ◽  
Vol 07 (05n06) ◽  
pp. 667-671 ◽  
Author(s):  
A. KAKIZAKI ◽  
N. KAMAKURRA ◽  
M. SAWADA ◽  
K. HAYASHI ◽  
T. SAITOH

The magnetic properties of fcc Fe thin films with a thickness of 1–11 monolayers (ML) grown at room temperature on fcc Co, which was prepared more than 15 ML on Cu(001), have been studied by spin-resolved core level and valence band photoelectron spectroscopy. The observed exchange split valence band structures show that Fe films below 11 ML are in a high spin ferromagnetic phase. Based on the line shape analysis of 3s core level spectra with a cluster model calculation and considering the probing depth of photoelectron spectroscopy, we demonstrate that in the 5–11 ML region, only the topmost few layers of Fe film reveal ferromagnetism as observed in the Fe/Cu(001) system.


Author(s):  
Dmitry Gorkov ◽  
Boris P. Toperverg ◽  
Hartmut Zabel

Traditionally, neutron scattering is an essential method for the analysis of spin structures and spin excitations in bulk materials. Over the last 30 years, polarized neutron scattering in terms of reflectometry has also contributed largely to the analysis of magnetic thin films and magnetic multilayers. More recently it has been shown that polarized neutron reflectivity is, in addition, a suitable tool for the study of thin films laterally patterned with magnetic stripes or islands. We provide a brief overview of the fundamental properties of polarized neutron reflectivity, considering different domain states, domain fluctuations, and different domain sizes with respect to the neutron coherence volume. The discussion is exemplified by a set of simulated reflectivities assuming either complete polarization and polarization analysis, or a reduced form of polarized neutron reflectivity without polarization analysis. Furthermore, we emphasize the importance of the neutron coherence volume for the interpretation of specular and off-specular intensity maps, in particular when studying laterally non-homogeneous magnetic films. Finally, experimental results, fits, and simulations are shown for specular and off-specular scattering from a magnetic film that has been lithographically patterned into a periodic stripe array. These experiments demonstrate the different and mutually complementary information that can be gained when orienting the stripe array parallel or perpendicular to the scattering plane.


1998 ◽  
Vol 22 (4_1) ◽  
pp. 186-189
Author(s):  
M. Matsumoto ◽  
A. Morisako ◽  
Y. Mutoh

2010 ◽  
Vol 130 (7) ◽  
pp. 621-625
Author(s):  
Hajime Ishioka ◽  
Mari Tahara ◽  
Kohtaro Sato ◽  
Natsumi Oka ◽  
Toshiyuki Shima

2019 ◽  
pp. 20-25
Author(s):  
Anna Chlenova ◽  
◽  
Elizaveta Golubeva ◽  
Iuliia Novoselova ◽  
Ruslan Salikhov ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document