High-resolution characterization of multiferroic heterojunction using aberration-corrected scanning transmission electron microscopy

Applied Physics Letters ◽

10.1063/1.4982627 ◽

2017 ◽

Vol 110 (17) ◽

pp. 171602 ◽

Author(s):

Zhoushen Yuan ◽

Jieji Ruan ◽

Lin Xie ◽

Xiaoqing Pan ◽

Di Wu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Aberration Corrected High-Resolution Transmission and Scanning Transmission Electron Microscopy of Thin Perovskite Layers

Physics Procedia ◽

10.1016/j.phpro.2012.12.007 ◽

2013 ◽

Vol 40 ◽

pp. 49-55 ◽

Author(s):

T. Walther ◽

I.M. Ross

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Atomic Characterization of Byproduct Nanoparticles on Cesium Lead Halide Nanocrystals Using High-Resolution Scanning Transmission Electron Microscopy

Crystals ◽

10.3390/cryst8010002 ◽

2017 ◽

Vol 8 (1) ◽

pp. 2 ◽

Author(s):

Mian Zhang ◽

Hongbo Li ◽

Qiang Jing ◽

Zhenda Lu ◽

Peng Wang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

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High Resolution Scanning Transmission Electron Microscopy (STEM) and Luminescence Characterization of ZnS/ZnSe Multi Quantum Wells (MQW) Grown by MOVPE

Sixth International Conference Metalorganic Vapor Phase Epitaxy ◽

10.1109/movpe.1992.665045 ◽

2005 ◽

Author(s):

B. Bollig ◽

P. Thorhauer ◽

E. Kubaleki ◽

J. Sollner ◽

F.E.G. Guimaraes ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Quantum Wells ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Aberration-corrected Scanning Transmission Electron Microscopy for Atomic-scale Characterization of Semiconductor Devices

ECS Transactions ◽

10.1149/1.2779062 ◽

2019 ◽

Vol 11 (3) ◽

pp. 225-231

Author(s):

Klaus Van Benthem ◽

Stephen J Pennycook

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Atomic Scale ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Scale Characterization ◽

Aberration Corrected

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Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927607076428 ◽

2007 ◽

Vol 13 (S02) ◽

Author(s):

M Oxley ◽

K van Benthem ◽

Y Peng ◽

S Pennycook

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Image Contrast ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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High resolution scanning transmission electron microscopy (STEM) and luminescence characterization of ZnS/ZnSe multi quantum wells (MQWs) grown by MOVPE

Journal of Crystal Growth ◽

10.1016/0022-0248(92)90530-v ◽

1992 ◽

Vol 124 (1-4) ◽

pp. 639-646 ◽

Author(s):

B. Bollig ◽

P. Thorhauer ◽

E. Kubalek ◽

J. Söllner ◽

F.E.G. Guimarães ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Quantum Wells ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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High-resolution scanning transmission electron microscopy

Ultramicroscopy ◽

10.1016/0304-3991(93)90044-x ◽

1993 ◽

Vol 52 (3-4) ◽

pp. 335-346 ◽

Author(s):

J. Liu ◽

J.M. Cowley

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

Aberration Corrected

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Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2012.04.018 ◽

2012 ◽

Vol 43 (10) ◽

pp. 1068-1072 ◽

Author(s):

Paul D. Robb ◽

Michael Finnie ◽

Alan J. Craven

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Short Period ◽

Scanning Transmission ◽

Short Period Superlattices ◽

Aberration Corrected

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Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Advances in Imaging and Electron Physics - Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy ◽

10.1016/s1076-5670(08)01008-2 ◽

2008 ◽

pp. 283-325 ◽

Author(s):

Angus I. Kirkland ◽

Peter D. Nellist ◽

Lan-Yun Chang ◽

Sarah J. Haigh

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Conventional Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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