scholarly journals Creation and annealing of metastable defect states in CH3NH3PbI3 at low temperatures

2018 ◽  
Vol 112 (8) ◽  
pp. 081102 ◽  
Author(s):  
F. Lang ◽  
O. Shargaieva ◽  
V. V. Brus ◽  
J. Rappich ◽  
N. H. Nickel
1983 ◽  
Vol 71 (1-2) ◽  
pp. 1-8 ◽  
Author(s):  
Yu. V. Gorelkinskii ◽  
N. N. Nevinnyi

2010 ◽  
Vol 1245 ◽  
Author(s):  
Arno H.M. Smets ◽  
Chris R. Wronski ◽  
Miro Zeman ◽  
M. van de Sanden

AbstractIn the recent years more and more theoretical and experimental evidence have been found that the hydrogen bonded to silicon in dense hydrogenated amorphous silicon (a-Si:H) predominantly resides in hydrogenated divacancies. In this contribution we will philosophize about the option that the small fraction of divacancies, missing at least one of its bonded hydrogen, may correspond to some of the native and metastable defect states of a-Si:H. We will discuss that such defect entities are an interesting basis for new and alternative views on the origin of the SWE.


1989 ◽  
Vol 149 ◽  
Author(s):  
R. A Street ◽  
K. Winer

ABSTRACTMeasurements are reported of metastable defect states in undoped a-Si: H, with the aim of understanding the relation between the different types of metastability. The temperature dependence of the thermal equilibrium defect density agrees well with a proposed thermodynamic model and their relaxation time varies with deposition conditions. The rate of light induced defect creation and annealing in samples deposited at low temperature and with a large initial defect density, decreases progressively as the irreversible defects are removed by annealing.


1997 ◽  
Vol 482 ◽  
Author(s):  
C. H. Qiu ◽  
J. I Pankove ◽  
I. Akasaki ◽  
H. Amano

AbstractThe photoconductivity response of Mg-doped GaN thin films was studied in the time domain of 50 nanoseconds to a few milliseconds in the temperature range of 100K to 390K. The response time, defined as the time when the photocurrent decreased to half its maximum value, is in the sub-microseconds at room temperature, but increased to a few microseconds at low temperatures. The contact capacitance is suspected for this behavior. Slower decay components due to trapping at defect states were also observed.


1991 ◽  
Vol 137-138 ◽  
pp. 287-290 ◽  
Author(s):  
A. Hamed ◽  
H. Fritzsche ◽  
X.-M. Deng ◽  
S. Köhler ◽  
R. Gupta

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