Degradation analysis of AlGaN/GaN high electron mobility transistor by electroluminescence, electric field-induced optical second-harmonic generation, and photoluminescence imaging

2018 ◽  
Vol 113 (1) ◽  
pp. 012106 ◽  
Author(s):  
Takashi Katsuno ◽  
Takaaki Manaka ◽  
Narumasa Soejima ◽  
Tsuyoshi Ishikawa ◽  
Mitsumasa Iwamoto
1995 ◽  
Vol 336 (1-2) ◽  
pp. 225-231 ◽  
Author(s):  
O.A. Aktsipetrov ◽  
A.V. Melnikov ◽  
T.V. Murzina ◽  
A.A. Nikulin ◽  
A.N. Rubtsov

1995 ◽  
Vol 20 (19) ◽  
pp. 1997 ◽  
Author(s):  
G. Lüpke ◽  
S. Lehmann ◽  
G. Marowsky ◽  
C. Meyer ◽  
C. Ohlhoff ◽  
...  

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