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Determination of critical layer thickness in InxGa1−xAs/GaAs heterostructures by x‐ray diffraction
Applied Physics Letters
◽
10.1063/1.98004
◽
1987
◽
Vol 50
(15)
◽
pp. 980-982
◽
Cited By ~ 179
Author(s):
P. J. Orders
◽
B. F. Usher
Keyword(s):
Layer Thickness
◽
Critical Layer
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
X Ray
Download Full-text
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References
Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication
Journal of Electronic Materials
◽
10.1007/s11664-999-0111-1
◽
1999
◽
Vol 28
(5)
◽
pp. 553-558
◽
Cited By ~ 18
Author(s):
X. G. Zhang
◽
P. Li
◽
D. W. Parent
◽
G. Zhao
◽
J. E. Ayers
◽
...
Keyword(s):
Layer Thickness
◽
Critical Layer
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
X Ray
◽
Dislocation Multiplication
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Determination of critical layer thickness and strain tensor in InxGa1−xAs/GaAs quantum‐well structures by x‐ray diffraction
Journal of Applied Physics
◽
10.1063/1.354030
◽
1993
◽
Vol 73
(11)
◽
pp. 7389-7394
◽
Cited By ~ 35
Author(s):
Y. C. Chen
◽
P. K. Bhattacharya
Keyword(s):
Quantum Well
◽
Layer Thickness
◽
Strain Tensor
◽
Critical Layer
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
Quantum Well Structures
◽
X Ray
Download Full-text
Accurate determination of misfit strain, layer thickness, and critical layer thickness in ultrathin buried strained InGaAs/GaAs layer by x-ray diffraction
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.586445
◽
1992
◽
Vol 10
(2)
◽
pp. 769
◽
Cited By ~ 8
Author(s):
Y. C. Chen
Keyword(s):
Layer Thickness
◽
Accurate Determination
◽
Misfit Strain
◽
Gaas Layer
◽
Critical Layer
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
X Ray
◽
Strain Layer
Download Full-text
Enhanced nonradiative recombination in Al x Ga1−x N-based quantum wells thinner than the critical layer thickness determined by X-ray diffraction
Applied Physics Express
◽
10.35848/1882-0786/abe658
◽
2021
◽
Vol 14
(3)
◽
pp. 031007
Author(s):
Shuhei Ichikawa
◽
Mitsuru Funato
◽
Yoichi Kawakami
Keyword(s):
Quantum Wells
◽
Layer Thickness
◽
Critical Layer
◽
Nonradiative Recombination
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
X Ray
Download Full-text
Critical layer thickness of strained-layer InGaAs/GaAs multiple quantum wells determined by double-crystal x-ray diffraction
Journal of Electronic Materials
◽
10.1007/bf02817701
◽
1993
◽
Vol 22
(11)
◽
pp. 1365-1368
◽
Cited By ~ 5
Author(s):
C. A. Wang
◽
S. H. Groves
◽
J. H. Reinold
◽
D. R. Calawa
Keyword(s):
Quantum Wells
◽
Layer Thickness
◽
Multiple Quantum Wells
◽
Critical Layer
◽
Multiple Quantum
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
Double Crystal
◽
X Ray
◽
Strained Layer
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Critical layer thickness in AlGaAsSbGaSb heterostructures determined by X-ray diffraction
Journal of Crystal Growth
◽
10.1016/0022-0248(93)90840-s
◽
1993
◽
Vol 130
(1-2)
◽
pp. 96-100
◽
Cited By ~ 10
Author(s):
J.L. Lazzari
◽
C. Fouillant
◽
P. Grunberg
◽
J.L. Leclercq
◽
A. Joullié
◽
...
Keyword(s):
Layer Thickness
◽
Critical Layer
◽
X Ray Diffraction
◽
Critical Layer Thickness
◽
X Ray
Download Full-text
Critical layer thickness determination of GaN/InGaN/GaN double heterostructures
Applied Physics Letters
◽
10.1063/1.1334361
◽
2000
◽
Vol 77
(25)
◽
pp. 4121-4123
◽
Cited By ~ 63
Author(s):
M. J. Reed
◽
N. A. El-Masry
◽
C. A. Parker
◽
J. C. Roberts
◽
S. M. Bedair
Keyword(s):
Layer Thickness
◽
Critical Layer
◽
Critical Layer Thickness
◽
Thickness Determination
◽
Double Heterostructures
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Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
Materials Science Forum
◽
10.4028/www.scientific.net/msf.79-82.165
◽
1991
◽
Vol 79-82
◽
pp. 165-168
Author(s):
H.-G. Brühl
◽
H. Rhan
Keyword(s):
High Resolution
◽
Layer Thickness
◽
Epitaxial Layers
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Determination of the critical layer thickness in the InGaN/GaN heterostructures
Applied Physics Letters
◽
10.1063/1.125146
◽
1999
◽
Vol 75
(18)
◽
pp. 2776-2778
◽
Cited By ~ 98
Author(s):
C. A. Parker
◽
J. C. Roberts
◽
S. M. Bedair
◽
M. J. Reed
◽
S. X. Liu
◽
...
Keyword(s):
Layer Thickness
◽
Critical Layer
◽
Critical Layer Thickness
Download Full-text
Determination of the critical layer thickness of GaAs/InGaAs strained quantum wells by scanning near-field optical spectroscopy
Compound Semiconductors 2001
◽
10.1201/9781482268980-67
◽
2002
◽
pp. 481-486
Keyword(s):
Quantum Wells
◽
Layer Thickness
◽
Optical Spectroscopy
◽
Near Field
◽
Critical Layer
◽
Critical Layer Thickness
◽
Strained Quantum Wells
Download Full-text
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