scholarly journals Photodissociation of aqueous I 3 − observed with liquid-phase ultrafast mega-electron-volt electron diffraction

2020 ◽  
Vol 7 (6) ◽  
pp. 064901
Author(s):  
K. Ledbetter ◽  
E. Biasin ◽  
J. P. F. Nunes ◽  
M. Centurion ◽  
K. J. Gaffney ◽  
...  
Author(s):  
Joao Pedro Figueira Nunes ◽  
Kathryn Ledbetter ◽  
Ming-Fu Lin ◽  
Michael Kozina ◽  
Elisa Biasin ◽  
...  

2020 ◽  
Vol 7 (2) ◽  
pp. 024301 ◽  
Author(s):  
J. P. F. Nunes ◽  
K. Ledbetter ◽  
M. Lin ◽  
M. Kozina ◽  
D. P. DePonte ◽  
...  

2019 ◽  
Vol 6 (5) ◽  
pp. 054305 ◽  
Author(s):  
X. Shen ◽  
J. P. F. Nunes ◽  
J. Yang ◽  
R. K. Jobe ◽  
R. K. Li ◽  
...  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Xi Yang ◽  
Junjie Li ◽  
Mikhail Fedurin ◽  
Victor Smaluk ◽  
Lihua Yu ◽  
...  

AbstractA real-time, nondestructive, Bragg-diffracted electron beam energy, energy-spread and spatial-pointing jitter monitor is experimentally verified by encoding the electron beam energy and spatial-pointing jitter information into the mega-electron-volt ultrafast electron diffraction pattern. The shot-to-shot fluctuation of the diffraction pattern is then decomposed to two basic modes, i.e., the distance between the Bragg peaks as well as its variation (radial mode) and the overall lateral shift of the whole pattern (drift mode). Since these two modes are completely decoupled, the Bragg-diffraction method can simultaneously measure the shot-to-shot energy fluctuation from the radial mode with 2·10−4 precision and spatial-pointing jitter from the drift mode having wide measurement span covering energy jitter range from 10−4 to 10−1. The key advantage of this method is that it allows us to extract the electron beam energy spread concurrently with the ongoing experiment and enables online optimization of the electron beam especially for future high charge single-shot ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) experiments. Furthermore, real-time energy measurement enables the filtering process to remove off-energy shots, improving the resolution of time-resolved UED. As a result, this method can be applied to the entire UED user community, beyond the traditional electron beam diagnostics of accelerators used by accelerator physicists.


2018 ◽  
Vol 13 (06) ◽  
pp. P06014-P06014 ◽  
Author(s):  
B.K. Ofori-Okai ◽  
M.C. Hoffmann ◽  
A.H. Reid ◽  
S. Edstrom ◽  
R.K. Jobe ◽  
...  

2006 ◽  
Vol 12 (6) ◽  
pp. 506-514 ◽  
Author(s):  
Christoph T. Koch ◽  
Wilfried Sigle ◽  
Rainer Höschen ◽  
Manfred Rühle ◽  
Erik Essers ◽  
...  

We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.


1993 ◽  
Vol 317 ◽  
Author(s):  
F. Banhart ◽  
N. Nagel ◽  
F. Phillipp ◽  
E. Bauser

ABSTRACTDefect-free coalescence of Si layers which grow laterally over partially oxidized Si substrates is achieved in liquid phase epitaxy from indium solution. An adequate design of the oxide pattern on (111) substrates ascertains that the growth fronts of the Si layers merge gradually on the SiO2 and avoids the formation of inclusions or crystallographic defects. Electron Microscopy in diffraction contrast and convergent beam electron diffraction reveal that the epitaxial Si layers bend towards the substrate as they grow laterally over the SiO2 film. The layers straighten out again as they merge and form a perfect seam of coalescence.


2015 ◽  
Vol 86 (7) ◽  
pp. 073702 ◽  
Author(s):  
S. P. Weathersby ◽  
G. Brown ◽  
M. Centurion ◽  
T. F. Chase ◽  
R. Coffee ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document