ELECTRON-MICROSCOPE OBSERVATION OF DISLOCATIONS IN METALS

Soviet Physics Uspekhi ◽

10.1070/pu1962v005n01abeh003400 ◽

1962 ◽

Vol 5 (1) ◽

pp. 53-78 ◽

Author(s):

L G Orlov ◽

M P Usikov ◽

L M Utevskii

Keyword(s):

Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation

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Electron-microscope observation of dislocations in metals

Uspekhi Fizicheskih Nauk ◽

10.3367/ufnr.0076.196201e.0109 ◽

1962 ◽

Vol 76 (1) ◽

pp. 109-152 ◽

Author(s):

L.G. Orlov ◽

M.P. Usikov ◽

L.M. Utevskii

Keyword(s):

Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation

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Minor Special Issue on Corrosion. Transmission Electron Microscope Observation of Grain Boundary Precipitates in an Al-1mass% Mg2Si Alloy.

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.42.949 ◽

1993 ◽

Vol 42 (479) ◽

pp. 949-954 ◽

Author(s):

Susumu IKENO ◽

Masanobu UWANORI ◽

Masakazu ISURUGI ◽

Kenji MATSUDA ◽

Shizuo TADA ◽

...

Keyword(s):

Electron Microscope ◽

Grain Boundary ◽

Transmission Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Special Issue ◽

Transmission Electron Microscope Observation ◽

Transmission Electron

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ELECTRON MICROSCOPE OBSERVATION OF LATTICE DISORDER IN ION‐IMPLANTED SILICON

Applied Physics Letters ◽

10.1063/1.1653654 ◽

1971 ◽

Vol 18 (6) ◽

pp. 257-259 ◽

Author(s):

M. Bertolotti ◽

D. Sette ◽

L. Stagni ◽

G. Vitali

Keyword(s):

Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Lattice Disorder ◽

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Chemical characterization of an oil/water emulsion interface via electron microscope observation of a frozen hydrated sample

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(88)90431-6 ◽

1988 ◽

Vol 121 (1) ◽

pp. 273-277 ◽

Author(s):

R.J Mikula

Keyword(s):

Electron Microscope ◽

Chemical Characterization ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Water Emulsion ◽

Oil Water ◽

Hydrated Sample

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Transmission electron microscope observation of the {001} 〈110〉 glide system in spinel nickel ferrite at room temperature

Philosophical Magazine A ◽

10.1080/01418617908239308 ◽

1979 ◽

Vol 39 (6) ◽

pp. 815-819 ◽

Author(s):

P. Veyssiére ◽

J. Rabier ◽

H. Garem

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Nickel Ferrite ◽

Room Temperature ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Transmission Electron Microscope Observation ◽

Transmission Electron

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In situ reflection electron microscope observation of two-dimensional nucleation on Si(111) during epitaxial growth

Thin Solid Films ◽

10.1016/0040-6090(96)08564-1 ◽

1996 ◽

Vol 281-282 ◽

pp. 20-23 ◽

Author(s):

A.V. Latyshev ◽

A.B. Krasilnikov ◽

A.L. Aseev

Keyword(s):

Electron Microscope ◽

Epitaxial Growth ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Two Dimensional

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Electron Microscope Observation and Structure Control of Single-Wall Carbon Nanotube Bundles, Single Crystals and Composite Fibers

Sen i Gakkaishi ◽

10.2115/fiber.67.p_132 ◽

2011 ◽

Vol 67 (5) ◽

pp. P.132-P.135

Author(s):

TETSUYA UCHIDA ◽

NAOYA TSUGAWA ◽

TAKUYA AKAISHI

Keyword(s):

Electron Microscope ◽

Carbon Nanotube ◽

Single Crystals ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Composite Fibers ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Structure Control ◽

Nanotube Bundles

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Effect of ZnDTP triboflim's morphology on friction behaviors of DLC coatings: Tribofilm characterization by 3D scanning electron microscope observation

Journal of Advanced Mechanical Design Systems and Manufacturing ◽

10.1299/jamdsm.2018jamdsm0129 ◽

2018 ◽

Vol 12 (7) ◽

pp. JAMDSM0129-JAMDSM0129 ◽

Author(s):

Kouami Auxence Melardot ABOUA ◽

Noritsugu UMEHARA ◽

Hiroyuki KOUSAKA ◽

Takayuki TOKOROYAMA ◽

Motoyuki MURASHIMA ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

3D Scanning ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Dlc Coatings ◽

Scanning Electron Microscope Observation ◽

Scanning Electron

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In-situ scanning electron microscope observation of electromigration-induced void growth in 30 nm ½ pitch Cu interconnect structures

Journal of Applied Physics ◽

10.1063/1.4866330 ◽

2014 ◽

Vol 115 (7) ◽

pp. 074305 ◽

Author(s):

K. Vanstreels ◽

P. Czarnecki ◽

T. Kirimura ◽

Y. K. Siew ◽

I. De Wolf ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Void Growth ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Scanning Electron Microscope Observation ◽

Cu Interconnect ◽

Scanning Electron

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Transmission electron microscope observation of dark defects appearing in InGaAsP/InP double heterostructure lasers aged at accelerated operation

Applied Physics Letters ◽

10.1063/1.93129 ◽

1982 ◽

Vol 40 (6) ◽

pp. 525-527 ◽

Author(s):

K. Wakita ◽

H. Takaoka ◽

M. Seki ◽

M. Fukuda

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Double Heterostructure ◽

Transmission Electron Microscope Observation ◽

Transmission Electron

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