scholarly journals Convergent evolution of processivity in bacterial and fungal cellulases

2020 ◽  
Vol 117 (33) ◽  
pp. 19896-19903 ◽  
Author(s):  
Taku Uchiyama ◽  
Takayuki Uchihashi ◽  
Akihiko Nakamura ◽  
Hiroki Watanabe ◽  
Satoshi Kaneko ◽  
...  

Cellulose is the most abundant biomass on Earth, and many microorganisms depend on it as a source of energy. It consists mainly of crystalline and amorphous regions, and natural degradation of the crystalline part is highly dependent on the degree of processivity of the degrading enzymes (i.e., the extent of continuous hydrolysis without detachment from the substrate cellulose). Here, we report high-speed atomic force microscopic (HS-AFM) observations of the movement of four types of cellulases derived from the cellulolytic bacteriaCellulomonas fimion various insoluble cellulose substrates. The HS-AFM images clearly demonstrated that two of them (CfCel6B andCfCel48A) slide on crystalline cellulose. The direction of processive movement ofCfCel6B is from the nonreducing to the reducing end of the substrate, which is opposite that of processive cellulase Cel7A of the fungusTrichoderma reesei(TrCel7A), whose movement was first observed by this technique, whileCfCel48A moves in the same direction asTrCel7A. WhenCfCel6B andTrCel7A were mixed on the same substrate, “traffic accidents” were observed, in which the two cellulases blocked each other’s progress. The processivity ofCfCel6B was similar to those of fungal family 7 cellulases but considerably higher than those of fungal family 6 cellulases. The results indicate that bacteria utilize family 6 cellulases as high-processivity enzymes for efficient degradation of crystalline cellulose, whereas family 7 enzymes have the same function in fungi. This is consistent with the idea of convergent evolution of processive cellulases in fungi and bacteria to achieve similar functionality using different protein foldings.

2009 ◽  
Vol 284 (52) ◽  
pp. 36186-36190 ◽  
Author(s):  
Kiyohiko Igarashi ◽  
Anu Koivula ◽  
Masahisa Wada ◽  
Satoshi Kimura ◽  
Merja Penttilä ◽  
...  

Cellulose ◽  
2014 ◽  
Vol 21 (6) ◽  
pp. 3927-3939 ◽  
Author(s):  
Thomas Ganner ◽  
Timothy Aschl ◽  
Manuel Eibinger ◽  
Patricia Bubner ◽  
Arno Meingast ◽  
...  

2012 ◽  
Vol 102 (3) ◽  
pp. 585a-586a
Author(s):  
Takayuki Uchihashi ◽  
Kiyohiko Igarashi ◽  
Anu Koivula ◽  
Masahisa Wada ◽  
Merja Penttil ◽  
...  

2017 ◽  
Vol 137 (10) ◽  
pp. 753-759
Author(s):  
Tomoki Enmei ◽  
Hiroshi Fujimoto ◽  
Yoichi Hori
Keyword(s):  

Author(s):  
LiLung Lai ◽  
Nan Li ◽  
Qi Zhang ◽  
Tim Bao ◽  
Robert Newton

Abstract Owing to the advancing progress of electrical measurements using SEM (Scanning Electron Microscope) or AFM (Atomic Force Microscope) based nanoprober systems on nanoscale devices in the modern semiconductor laboratory, we already have the capability to apply DC sweep for quasi-static I-V (Current-Voltage), high speed pulsing waveform for the dynamic I-V, and AC imposed for C-V (Capacitance-Voltage) analysis to the MOS devices. The available frequency is up to 100MHz at the current techniques. The specification of pulsed falling/rising time is around 10-1ns and the measurable capacitance can be available down to 50aF, for the nano-dimension down to 14nm. The mechanisms of dynamic applications are somewhat deeper than quasi-static current-voltage analysis. Regarding the operation, it is complicated for pulsing function but much easy for C-V. The effective FA (Failure Analysis) applications include the detection of resistive gate and analysis for abnormal channel doping issue.


Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


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