Use of Ion Scattering and Secondary Ion Mass Spectrometry to Characterize Apparent “Adhesive” Failure in an Adhesive Bond

The Journal of Adhesion ◽

10.1080/00218467608075057 ◽

1976 ◽

Vol 7 (4) ◽

pp. 261-267 ◽

Author(s):

W. L. Baun

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Bond ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Abstract: Surface analytical studies using ion scattering spectrometry, Auger electron spectroscopy and secondary ion mass spectrometry

Journal of Vacuum Science and Technology ◽

10.1116/1.568786 ◽

1975 ◽

Vol 12 (1) ◽

pp. 352-353 ◽

Author(s):

W. Heiland ◽

E. Taglauer

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Analytical Studies ◽

Ion Mass Spectrometry ◽

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Ion scattering spectrometry and secondary ion mass spectrometry in the surface characterization of smut on stainless steel

Surface Technology ◽

10.1016/0376-4583(80)90099-0 ◽

1980 ◽

Vol 11 (6) ◽

pp. 385-391 ◽

Author(s):

W.L. Baun

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Characterization ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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Secondary ion mass spectrometry and ion scattering spectrometry determination of iodide distribution in Ag(Br,I)

Vacuum ◽

10.1016/s0042-207x(81)80427-7 ◽

1981 ◽

Vol 31 (4-5) ◽

pp. 212

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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7676. An situ study of the reactive ion beam etching of tungsten with tetrafluoremethane/argon mixtures using ion scattering spectroscopy and secondary ion mass spectrometry

Vacuum ◽

10.1016/0042-207x(91)91744-9 ◽

1991 ◽

Vol 42 (10-11) ◽

pp. 694

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Ion Scattering ◽

Ion Beam Etching ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Reactive Ion Beam Etching

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Surface analysis of etched Magnox alloys by secondary ion mass spectrometry and ion scattering spectroscopy

Metal Science ◽

10.1179/030634584790419980 ◽

1984 ◽

Vol 18 (6) ◽

pp. 295-298 ◽

Author(s):

G. C. Allen

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Ion scattering spectroscopy and secondary ion mass spectrometry (ISS/SIMS) studies of zeolites

Journal of Catalysis ◽

10.1016/0021-9517(83)90012-x ◽

1983 ◽

Vol 84 (2) ◽

pp. 410-422 ◽

Author(s):

S SUIB

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Spatial enhancement and restoration of chemical images from secondary ion mass spectrometry and ion scattering spectrometry

Analytical Chemistry ◽

10.1021/ac00254a032 ◽

1983 ◽

Vol 55 (3) ◽

pp. 557-564 ◽

Author(s):

Bernard G. M. Vandeginste ◽

Bruce R. Kowalski

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Spatial Enhancement

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