SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Surface analysis of etched Magnox alloys by secondary ion mass spectrometry and ion scattering spectroscopy

Metal Science ◽

10.1179/030634584790419980 ◽

1984 ◽

Vol 18 (6) ◽

pp. 295-298 ◽

Author(s):

G. C. Allen

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and x-ray photoelectron spectroscopy for surface analysis of acrylic polymers

Analytical Chemistry ◽

10.1021/ac00235a037 ◽

1981 ◽

Vol 53 (12) ◽

pp. 1879-1884 ◽

Author(s):

Joseph A. Gardella ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Acrylic Polymers ◽

X Ray ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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7676. An situ study of the reactive ion beam etching of tungsten with tetrafluoremethane/argon mixtures using ion scattering spectroscopy and secondary ion mass spectrometry

Vacuum ◽

10.1016/0042-207x(91)91744-9 ◽

1991 ◽

Vol 42 (10-11) ◽

pp. 694

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Ion Scattering ◽

Ion Beam Etching ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Reactive Ion Beam Etching

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Ion scattering spectroscopy and secondary ion mass spectrometry (ISS/SIMS) studies of zeolites

Journal of Catalysis ◽

10.1016/0021-9517(83)90012-x ◽

1983 ◽

Vol 84 (2) ◽

pp. 410-422 ◽

Author(s):

S SUIB

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Sputtering of chlorinated silicon surfaces studied by secondary ion mass spectrometry and ion scattering spectroscopy

Journal of Applied Physics ◽

10.1063/1.334536 ◽

1985 ◽

Vol 57 (4) ◽

pp. 1336-1342 ◽

Author(s):

E. L. Barish ◽

D. J. Vitkavage ◽

T. M. Mayer

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Silicon Surfaces ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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Surface analysis of plasma-deposited polymer films by Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) before and after exposure to ambient air

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2005.02.032 ◽

2005 ◽

Vol 200 (1-4) ◽

pp. 463-467 ◽

Author(s):

U. Oran ◽

S. Swaraj ◽

J.F. Friedrich ◽

W.E.S. Unger

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Polymer Films ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ambient Air ◽

Ion Mass Spectrometry ◽

Before And After ◽

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Direct Surface Analysis of Pesticides on Soil, Leaves, Grass, and Stainless Steel by Static Secondary Ion Mass Spectrometry

Environmental Science & Technology ◽

10.1021/es960213h ◽

1997 ◽

Vol 31 (2) ◽

pp. 402-408 ◽

Author(s):

Jani C. Ingram ◽

Gary S. Groenewold ◽

Anthony D. Appelhans ◽

James E. Delmore ◽

John E. Olson ◽

...

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Abstract: Surface analytical studies using ion scattering spectrometry, Auger electron spectroscopy and secondary ion mass spectrometry

Journal of Vacuum Science and Technology ◽

10.1116/1.568786 ◽

1975 ◽

Vol 12 (1) ◽

pp. 352-353 ◽

Author(s):

W. Heiland ◽

E. Taglauer

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Analytical Studies ◽

Ion Mass Spectrometry ◽

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