Effect of Particle Impact on Surface Cleaning Using Dry Ice Jet

Erosion caused by solid particle impact is a very common phenomenon. In many fields such as particle (or slurry) transportation, equipment protection in a dust environment, turbine engineering, etc., prevention of particle erosion is the task. In other applications, it is used as a tool for desirable material removal, surface cleaning, controlled destruction, numerous studies on this subject have been conducted by researchers from many disciplines including physics, material science, mechanics, manufacturing, standardization, etc.. To provide a comprehensive view of the problem of erosion by solid particle impact, a review is conducted based on the literature collected on material subject of erosion by solid particle impact. The reviewed works are limited to ductile material erosion and four categories: erosion mechanism, parametric studies, material removal modeling and simulation modeling.

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Characteristics of Dry Ice Particles Produced by Expanding Liquid Carbon Dioxide and its Application for Surface Cleaning

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.508.38 ◽

2012 ◽

Vol 508 ◽

pp. 38-42 ◽

Cited By ~ 2

Author(s):

Yi Hung Liu ◽

Shuji Matsusaka

Keyword(s):

Carbon Dioxide ◽

Surface Cleaning ◽

Particle Removal ◽

Liquid Carbon ◽

Dry Ice ◽

Liquid Carbon Dioxide ◽

Ice Particles ◽

Median Diameter ◽

Mass Median ◽

Mass Median Diameter

The characteristics of dry ice particles produced by expanding liquid carbon dioxide and its application for surface cleaning have been studied experimentally. The production of the dry ice particles was based on the Joule-Thomson effect. The ejected dry ice particles were observed using a high-speed microscope camera. Through digital image processing, the particle size and particle velocity in the jet were analyzed. To in-situ measure the size distribution of the dry ice particles, a laser diffraction method was used. The experimental results showed that the primary dry ice particles ejected from the expansion nozzle were about 1 μm in mass median diameter. The presence of a thermally insulated tube at the outlet of the nozzle enhanced the agglomeration of the particles, whereby agglomerates of about 100 μm in mass median diameter were formed. The performance of dry ice jet for removing fine particles adhering to surfaces was also evaluated using microscopic observation. It was found that the particle removal process consists of two stagesslow removal stage and rapid removal stagethat are related to the jet temperature.

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Morphological Changes on Spruce Wood Surface, Induced by Treatment with Dry Ice

Materials Science Forum ◽

10.4028/www.scientific.net/msf.818.177 ◽

2015 ◽

Vol 818 ◽

pp. 177-180

Author(s):

Jozef Kúdela ◽

Leoš Mrenica ◽

Igor Čunderlík ◽

Pavel Šmíra

Keyword(s):

Surface Roughness ◽

Free Energy ◽

Surface Morphology ◽

Surface Treatment ◽

Wood Surface ◽

Morphological Changes ◽

Surface Cleaning ◽

Dry Ice ◽

Spruce Wood ◽

Effective Removal

This work concerns the changes to wood surface morphology induced by surface cleaning with dry ice. The surface roughness values demonstrated that the surface treatment with dry ice resulted in amplified surface roughness, mainly due to the increase in the roughness of early wood. The treatment of old wood with dry ice not only guarantees effective removal of contamination from the wood surface, it also induces positive changes in other (such as wettability, surface free energy, color, and similar). This way of wood surface treatment guarantees more wood surface quality for the surface treatment, impregnation or gluing.

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TEM characterization of silicon epitaxial layer grown on Si-TaS2, eutectic composites

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100088324 ◽

1991 ◽

Vol 49 ◽

pp. 802-803

Author(s):

C.M. Sung ◽

M. Levinson ◽

M. Tabasky ◽

K. Ostreicher ◽

B.M. Ditchek

Keyword(s):

Substrate Surface ◽

Bulk Sample ◽

Surface Cleaning ◽

Native Oxide ◽

Czochralski Growth ◽

Ion Milling ◽

Cross Sectional ◽

Cleaning Methods ◽

Field Emission Cathodes

Directionally solidified Si/TaSi2 eutectic composites for the development of electronic devices (e.g. photodiodes and field-emission cathodes) were made using a Czochralski growth technique. High quality epitaxial growth of silicon on the eutectic composite substrates requires a clean silicon substrate surface prior to the growth process. Hence a preepitaxial surface cleaning step is highly desirable. The purpose of this paper is to investigate the effect of surface cleaning methods on the epilayer/substrate interface and the characterization of silicon epilayers grown on Si/TaSi2 substrates by TEM.Wafers were cut normal to the <111> growth axis of the silicon matrix from an approximately 1 cm diameter Si/TaSi2 composite boule. Four pre-treatments were employed to remove native oxide and other contaminants: 1) No treatment, 2) HF only; 3) HC1 only; and 4) both HF and HCl. The cross-sectional specimens for TEM study were prepared by cutting the bulk sample into sheets perpendicular to the TaSi2 fiber axes. The material was then prepared in the usual manner to produce samples having a thickness of 10μm. The final step was ion milling in Ar+ until breakthrough occurred. The TEM samples were then analyzed at 120 keV using the Philips EM400T.

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