Evolution of temperature field of double cone specimen and strut during the heating stage of hot compression

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

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Precipitate coarsening during hot-compression testing of NiAl + 2 at.% Nb

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100144462 ◽

1986 ◽

Vol 44 ◽

pp. 598-599

Author(s):

W. M. Sherman ◽

K. M. Vedula

Keyword(s):

High Temperature ◽

Flow Stress ◽

Weight Ratio ◽

Constant Strain Rate ◽

Hot Compression ◽

Compression Testing ◽

Second Phase ◽

Precipitate Coarsening ◽

High Temperature Mechanical Properties ◽

Ordered Intermetallic

The strength to weight ratio and oxidation resistance of NiAl make this ordered intermetallic, with some modifications, an attractive candidate to compete with many superalloys for high temperature applications. Recent studies have shown that the inherent brittleness of many polycrystalline intermetallics can be overcome by micro and macroalloying. It has also been found that the high temperature mechanical properties of NiAl can be enhanced through the addition of Nb by powder metallurgical techniques forming a dispersed second phase through interdiffusion in a polycrystalline matrix. A drop in the flow stress is observed however in a NiAl-2 at.% Nb alloy after 0.2 % strain during constant strain rate hot compression testing at 1025°C. The object of this investigation was to identify the second phase and to determine the cause of the flow stress drop.

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Multiple-fracturing and viewing of the same frozen sample at different depths using a low temperature FESEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166567 ◽

1996 ◽

Vol 54 ◽

pp. 820-821

Author(s):

M.V. Parthasarathy ◽

C. Daugherty

Keyword(s):

Temperature Field ◽

Low Temperature ◽

Field Emission ◽

Multiple Fracture ◽

Precise Control ◽

Cold Stage ◽

Different Depths ◽

Transfer Device

The versatility of Low Temperature Field Emission SEM (LTFESEM) for viewing frozen-hydrated biological specimens, and the high resolutions that can be obtained with such instruments have been well documented. Studies done with LTFESEM have been usually limited to the viewing of small organisms, organs, cells, and organelles, or viewing such specimens after fracturing them.We use a Hitachi 4500 FESEM equipped with a recently developed BAL-TEC SCE 020 cryopreparation/transfer device for our LTFESEM studies. The SCE 020 is similar in design to the older SCU 020 except that instead of having a dedicated stage, the SCE 020 has a detachable cold stage that mounts on to the FESEM stage when needed. Since the SCE 020 has a precisely controlled lock manipulator for transferring the specimen table from the cryopreparation chamber to the cold stage in the FESEM, and also has a motor driven microtome for precise control of specimen fracture, we have explored the feasibility of using the LTFESEM for multiple-fracture studies of the same sample.

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