Properties of a-SiN x .: H films deposited at room temperature by the electron cyclotron resonance plasma method
1996 ◽
Vol 73
(3)
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pp. 487-502
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1998 ◽
Vol 317
(1-2)
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pp. 116-119
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2003 ◽
Vol 21
(4)
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pp. 1511
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