Single-shot X-ray scattering imaging

AbstractMicrostructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

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Single-shot studies of a Co/Pd thin film’s magnetic nano-domain structure using ultrafast x-ray scattering

Laser Physics ◽

10.1088/1054-660x/24/2/025301 ◽

2014 ◽

Vol 24 (2) ◽

pp. 025301 ◽

Cited By ~ 1

Author(s):

M Ducousso ◽

X Ge ◽

W Boutu ◽

D Gauthier ◽

B Barbrel ◽

...

Keyword(s):

Domain Structure ◽

Single Shot ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Single-shot, omni-directional x-ray scattering imaging with a laboratory source and single-photon localization

Optics Letters ◽

10.1364/ol.381420 ◽

2020 ◽

Vol 45 (4) ◽

pp. 1021 ◽

Cited By ~ 1

Author(s):

Erik S. Dreier ◽

Chantal Silvestre ◽

Jan Kehres ◽

Daniel Turecek ◽

Mohamad Khalil ◽

...

Keyword(s):

Single Photon ◽

Single Shot ◽

X Ray ◽

X Ray Scattering ◽

Laboratory Source ◽

Photon Localization ◽

Ray Scattering

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Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

IUCrJ ◽

10.1107/s205225252000144x ◽

2020 ◽

Vol 7 (2) ◽

pp. 276-286 ◽

Cited By ~ 1

Author(s):

Akinobu Niozu ◽

Yoshiaki Kumagai ◽

Toshiyuki Nishiyama ◽

Hironobu Fukuzawa ◽

Koji Motomura ◽

...

Keyword(s):

Free Electron ◽

Structural Information ◽

Single Shot ◽

X Ray Diffraction ◽

X Ray ◽

Angular Correlations ◽

Crystalline Defects ◽

X Ray Scattering ◽

Diffraction Patterns ◽

Ray Scattering

Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray pulses provided by X-ray free-electron lasers (XFELs) opened up the possibility of structure determination of nanometre-scale matter with Å spatial resolution. However, it is often difficult to reconstruct the 3D structural information from single-shot X-ray diffraction patterns owing to the random orientation of the particles. This report proposes an analysis approach for characterizing defects in nanoparticles using wide-angle X-ray scattering (WAXS) data from free-flying single nanoparticles. The analysis method is based on the concept of correlated X-ray scattering, in which correlations of scattered X-ray are used to recover detailed structural information. WAXS experiments of xenon nanoparticles, or clusters, were conducted at an XFEL facility in Japan by using the SPring-8 Ångstrom compact free-electron laser (SACLA). Bragg spots in the recorded single-shot X-ray diffraction patterns showed clear angular correlations, which offered significant structural information on the nanoparticles. The experimental angular correlations were reproduced by numerical simulation in which kinematical theory of diffraction was combined with geometric calculations. We also explain the diffuse scattering intensity as being due to the stacking faults in the xenon clusters.

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Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities

Journal of Synchrotron Radiation ◽

10.1107/s1600577519006647 ◽

2019 ◽

Vol 26 (5) ◽

pp. 1432-1447 ◽

Cited By ~ 5

Author(s):

Andreas Galler ◽

Wojciech Gawelda ◽

Mykola Biednov ◽

Christina Bomer ◽

Alexander Britz ◽

...

Keyword(s):

Pulse Length ◽

Scientific Instrument ◽

Single Shot ◽

Simultaneous Application ◽

X Ray ◽

Ultrafast Optical ◽

Near Ir ◽

X Ray Scattering ◽

Beam Parameters ◽

Ray Scattering

The European X-ray Free-Electron Laser (EuXFEL) delivers extremely intense (>1012 photons pulse−1 and up to 27000 pulses s−1), ultrashort (<100 fs) and transversely coherent X-ray radiation, at a repetition rate of up to 4.5 MHz. Its unique X-ray beam parameters enable novel and groundbreaking experiments in ultrafast photochemistry and material sciences at the Femtosecond X-ray Experiments (FXE) scientific instrument. This paper provides an overview of the currently implemented experimental baseline instrumentation and its performance during the commissioning phase, and a preview of planned improvements. FXE's versatile instrumentation combines the simultaneous application of forward X-ray scattering and X-ray spectroscopy techniques with femtosecond time resolution. These methods will eventually permit exploitation of wide-angle X-ray scattering studies and X-ray emission spectroscopy, along with X-ray absorption spectroscopy, including resonant inelastic X-ray scattering and X-ray Raman scattering. A suite of ultrafast optical lasers throughout the UV–visible and near-IR ranges (extending up to mid-IR in the near future) with pulse length down to 15 fs, synchronized to the X-ray source, serve to initiate dynamic changes in the sample. Time-delayed hard X-ray pulses in the 5–20 keV range are used to probe the ensuing dynamic processes using the suite of X-ray probe tools. FXE is equipped with a primary monochromator, a primary and secondary single-shot spectrometer, and a timing tool to correct the residual timing jitter between laser and X-ray pulses.

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2D-Omnidirectional Hard-X-Ray Scattering Sensitivity in a Single Shot

Physical Review Letters ◽

10.1103/physrevlett.116.093902 ◽

2016 ◽

Vol 116 (9) ◽

Cited By ~ 28

Author(s):

Matias Kagias ◽

Zhentian Wang ◽

Pablo Villanueva-Perez ◽

Konstantins Jefimovs ◽

Marco Stampanoni

Keyword(s):

Single Shot ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Fast Acquisition Protocol for X-ray Scattering Tensor Tomography

10.21203/rs.3.rs-599550/v1 ◽

2021 ◽

Author(s):

Jisoo Kim ◽

Matias Kagias ◽

Federica Marone ◽

Zhitian Shi ◽

Marco Stampanoni

Keyword(s):

Null Space ◽

Sufficient Information ◽

Single Shot ◽

Time Resolved ◽

X Ray ◽

Circular Pattern ◽

Rapid Acquisition ◽

Tensor Tomography ◽

X Ray Scattering ◽

Ray Scattering

Abstract Microstructural information over an entire sample is important to understand the macroscopic behavior of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. Leveraging on these new optical elements, we propose here simple yet inherently rapid acquisition protocols forX-ray scattering tensor tomography. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

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Diffractive small angle X-ray scattering imaging for anisotropic structures

Nature Communications ◽

10.1038/s41467-019-12635-2 ◽

2019 ◽

Vol 10 (1) ◽

Cited By ~ 11

Author(s):

Matias Kagias ◽

Zhentian Wang ◽

Mie Elholm Birkbak ◽

Erik Lauridsen ◽

Matteo Abis ◽

...

Keyword(s):

Small Angle ◽

Spatial Coherence ◽

Single Shot ◽

X Ray ◽

Spatially Resolved ◽

X Ray Scattering ◽

Wide Range ◽

Anisotropic Structures ◽

Micrometer Scale ◽

Ray Scattering

Abstract Insights into the micro- and nano-architecture of materials is crucial for understanding and predicting their macroscopic behaviour. In particular, for emerging applications such as meta-materials, the micrometer scale becomes highly relevant. The micro-architecture of such materials can be tailored to exhibit specific mechanical, optical or electromagnetic behaviours. Consequently, quality control at micrometer scale must be guaranteed over extended areas. Mesoscale investigations over millimetre sized areas can be performed by scanning small angle X-ray scattering methods (SAXS). However, due to their long measurement times, real time or operando investigations are hindered. Here we present a method based on X-ray diffractive optics that enables the acquisition of SAXS signals in a single shot (few milliseconds) over extended areas. This method is applicable to a wide range of X-ray sources with varying levels of spatial coherence and monochromaticity, as demonstrated from the experimental results. This enables a scalable solution of spatially resolved SAXS.

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