Beneficial effect of hydrogen in aluminum oxide deposited through the atomic layer deposition method on the electrical properties of an indium–gallium–zinc oxide thin-film transistor
2016 ◽
Vol 17
(2)
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pp. 65-71
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2019 ◽
Vol 217
(12)
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pp. 1900832
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2018 ◽
Vol 39
(5)
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pp. 688-691
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2020 ◽
Vol 41
(6)
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pp. 856-859
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2020 ◽
Vol 30
(34)
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pp. 2003285
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